Elimination of parasitic reflections for objects with high transparency in phase measuring deflectometry

Tao, Siwei; Yue, Huimin; Chen, Hongli; Tianhe, Wang; Cai, Jiawei; Wu, Yue; Liu, Yong

doi:10.1016/j.rinp.2019.102734

Cited by 15 publications

(2 citation statements)

References 13 publications

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“…In this case, multiple measurements with varied fringe periods allow one to separate several mixed signals (Faber et al, 2009;Huang and Asundi, 2012;Ye et al, 2021;Leung and Cai, 2022;Ordones et al, 2022;Zheng et al, 2022). Attempts have also been reported to use a model of the optical system's transfer function for signal separation (Wang, 2018;Tao et al, 2019). We are currently unaware of any efforts to implement the multi-frequency approach by means of any of the multiplexing schemes mentioned above.…”

Section: Handling Multiple Reflectionsmentioning

confidence: 99%

“…One difficulty with phase shifting is that defects featuring step-like changes in reflectivity induce artifacts in the measurement data that need to be accounted for to assess defects correctly (Gühring, 2000;Macher et al, 2014;Burke and Zhong, 2017;Wu et al, 2017;Patra et al, 2019;Tao et al, 2019). For such defects, it is sometimes sufficient to observe the fringe modulation only (Petz et al, 2018;Huang et al, 2019).…”

Section: Defect Detection and Classificationmentioning

confidence: 99%

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Deflectometry for specular surfaces: an overview

et al. 2023

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Deflectometry as a technique to assess reflective surfaces has now existed for some 40 years. Its different aspects and variations have been studied in multiple theses and research articles; reviews are available for certain subtopics. Still a field of active development with many unsolved problems, deflectometry now encompasses a large variety of application domains, hardware setup types, and processing workflows for different purposes, and spans a range from qualitative defect inspection of large vehicles to precision measurements of microscopic optics. Over these years, many exciting developments have accumulated in the underlying theory, in the systems design, and in the implementation specifics. This diversity of topics is difficult to grasp for experts and non-experts alike and may present an obstacle to a wider acceptance of deflectometry as a useful tool for research and industrial applications. This paper presents an attempt to summarize the status of deflectometry and to map relations between its notable branches. Its aim is to provide a communication basis for experienced practitioners and also to offer a convenient entry point for those interested in learning about the method. The list of references introduces some prominent trends and established research groups in order to facilitate further self-directed exploration.

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