2018
DOI: 10.1007/s11664-018-06872-2
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Ellipsometric Investigation of Room Temperature Grown Highly-Oriented Anatase TiO2 Thin Films

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Cited by 16 publications
(8 citation statements)
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“…[ 29,31 ] This could be due to the deformation in the film surfaces [ 65 ] as a consequence of the strain reported earlier by Jaiswal et al. [ 57 ] In addition, large oscillations are observed in TNO5 as compared to other samples indicating a large negative correlation between surface heights. The lateral correlation or autocorrelation length is defined as the length at which the autocorrelation function is reduced to 1/e of its original value.…”
Section: Resultsmentioning
confidence: 97%
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“…[ 29,31 ] This could be due to the deformation in the film surfaces [ 65 ] as a consequence of the strain reported earlier by Jaiswal et al. [ 57 ] In addition, large oscillations are observed in TNO5 as compared to other samples indicating a large negative correlation between surface heights. The lateral correlation or autocorrelation length is defined as the length at which the autocorrelation function is reduced to 1/e of its original value.…”
Section: Resultsmentioning
confidence: 97%
“…Mountains Map 8 premium software (trial version) was utilized for topographical analysis of the thin films. [ 57 ] The spatial, height, hybrid, functional (volume), feature, and Sk parameters were analyzed following ISO 25178‐2:2012 standard. [ 58 ] The 3D representation of AFM images for the investigated anatase thin‐film surfaces is shown in Figure .…”
Section: Resultsmentioning
confidence: 99%
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