1998
DOI: 10.1021/la971049u
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Ellipsometric Study of Multilayer Growth and Wetting of C2Cl2F4 Physisorbed on Graphite

Abstract: We have used ellipsometry to measure adsorption isotherms of C2Cl2F4 (1,1,2,2-tetrafluoro-1,2-dichloroethane) on a highly ordered pyrolytic graphite (HOPG) substrate in the temperature range from 98 to 185 K. Below the triple point temperature T t = 179.2 K, the system shows incomplete wetting. Above the bulk triple point, the isotherms show layer-by-layer growth in agreement with the Frenkel−Halsey−Hill model and consistent with complete wetting.

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Cited by 7 publications
(10 citation statements)
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“…9 Briefly, it employs the PCSA configuration ͑polarizer, Soleil-Babinet compensator, sample, analyzer͒. After passing through a polarizer and compensator, light from a He-Ne laser ͑wavelength ϭ6328 Å͒ is incident on the sample at an angle of 60°to the surface normal and illuminates an area of ϳ1 mm 2 .…”
Section: Methodsmentioning
confidence: 99%
“…9 Briefly, it employs the PCSA configuration ͑polarizer, Soleil-Babinet compensator, sample, analyzer͒. After passing through a polarizer and compensator, light from a He-Ne laser ͑wavelength ϭ6328 Å͒ is incident on the sample at an angle of 60°to the surface normal and illuminates an area of ϳ1 mm 2 .…”
Section: Methodsmentioning
confidence: 99%
“…These angles are valid for a null-ellipsometer setup with the incident angle and wavelength given in Table I. 22 We used two different methods to grow the films: ͑a͒ slow dip coating ͑SDC͒ at room temperature in a C32/ heptane solution and ͑b͒ physical vapor deposition ͑PVD͒. The SDC method is described elsewhere.…”
Section: A Materialsmentioning
confidence: 99%
“…The ellipsometer setup has been described previously. 16,22 Briefly, we use a null-PCSA configuration 25 with a fixed wavelength 0 and fixed angle of incidence , whose values are given in Table I. The resolution of the apparatus is of the order of 10 −3 deg in the polarizer angle, which is achieved by using a Faraday glass placed between the polarizer and the compensator and controlled by an electronic feedback loop.…”
Section: B Ellipsometrymentioning
confidence: 99%
“…(62) Optical techniques are useful over a wide range of ambient conditions, can be extremely sensitive and offer real-time detection. (63)(64)(65) A number of different optical techniques have been developed to study surfaces. For example, infrared (IR) spectroscopy is widely applied to investigate adsorbates on both metal and semiconductor surfaces.…”
Section: Optical Surface Probesmentioning
confidence: 99%
“…Optical differential reflectance (ODR) is an optical technique that has been applied to investigate adsorption and desorption on surfaces, resulting in estimation of coverage from optically determined film thickness. (65,71) This technique uses the small change induced in the reflectivity when a molecule adsorbs onto the surface. (72,73) ODR has been used to investigate adsorption and desorption kinetics of a chemisorbed species, CO, on a metal surface, Cu(100), at visible wavelengths (632 nm) under ultra high (71) , and NO on Cu(111).…”
Section: Optical Surface Probesmentioning
confidence: 99%