Ellipsometry of biological objects in the mode of attenuated  total reflection (ATR) using a circularly polarized laser light

Yatsishen, V. V.; Amelchenko, Yuliya

doi:10.1117/12.2564203

Cited by 3 publications

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“…The author of [15] considered the use of elliptically polarized light for the purposes of diagnosing the parameters of a thin film. The work [16] proposed a method of frustrated total reflection using circularly polarized light for ellipsometry of biological objects.…”

Section: Introductionmentioning

confidence: 99%

Diagnosis of a periodic nanostructure with a defect using circularly polarized light

Yatsyshen

2022

J. Phys.: Conf. Ser.

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The paper considers the reflection of a circularly polarized light wave from a periodic nanostructure. The method of characteristic matrices was used to calculate the ellipsometric parameters ρ 0 and Δ of reflected light. It is shown that a wave initially polarized in the left circle changes polarization upon reflection, turning into an elliptically polarized wave. The results obtained for an ideal periodic medium are compared with the results of reflection from a periodic medium with a single defect - the upper layer of the original periodic medium is replaced by an absorbing dielectric layer. The analysis showed that the spectral dependences of the ellipsometric parameters for two structures, periodic and defective, differ significantly. In the range of wavelengths λ from 0.4 μm to 0.6 μm, the ellipsometric parameter ρ 0 for the considered periodic medium and the medium with a defect differ significantly from each other - where the maximum is for one medium, there is approximately the minimum for the other. In turn, the parameter Δ demonstrates a significant difference for the two structures in the wavelength range λ from 0.46 μm to 0.55 μm. The use of circularly polarized light demonstrates wide possibilities for studying defects in periodic nanostructures.

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Section: Introductionmentioning

confidence: 99%

Diagnosis of a periodic nanostructure with a defect using circularly polarized light

Yatsyshen

2022

J. Phys.: Conf. Ser.

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Ellipsometry of thin films of biological objects under conditions of total internal reflection

Yatsishen

2022

PWPRS

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An analysis of the ellipsometric parameters of the reflected light from the prism test material air system is carried out when circularly polarized light is incident on it under the conditions of the onset of the phenomenon of total internal reflection. At the onset of total internal reflection, the ellipsometry parameter shows high variability with the angle of incidence, in contrast to the parameter r0. It is shown that TIR occurs when the angle of incidence is not equal to the critical angle of the adjacent media for two different materials, these angles differ from each other. In the case of a film, the TIR phenomenon occurs at an angle equal to the critical angle at the prism-air interface and does not depend on the film material. The results obtained show the high efficiency of using the ellipsometric method together with circularly polarized incident radiation for diagnostics of thin films made of biological material.

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Peculiarities of the spectrum of reflected and transmitted light of circular polarization for a thin layer of an anisotropic wurtzite-type crystal near phonon resonance

Yatsishen,

Borodina

2024

Physics of Wave Processes and Radio Systems

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Background. Polaritons attract the attention of researchers and engineers with their unique properties and promising applications in the field of micro- and nanoelectronics. Such applications could include devices such as transistors or even polaritons lasers, as have been reported in the scientific literature. Aim. The work analyzes the frequency reflection spectra upon excitation of polaritons, and also considers the change in the polarization ellipse upon reflection of circularly polarized light from an anisotropic crystal. Methods. Based on the wave equation in an anisotropic medium, a dispersion equation for polaritons is derived. To calculate energy reflection coefficients using the characteristic matrix method. Results. An aluminum nitride AlN crystal was chosen as the object of analysis. It is shown that the use of circularly polarized incident radiation makes it possible, using an anisotropic crystal, to change the nature of polarization from circular to almost linear polarization. Conclusion. The found dependence of the polarization of reflected light can be used in electronic devices based on polaritons.

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Ellipsometry of biological objects in the mode of attenuated total reflection (ATR) using a circularly polarized laser light

Cited by 3 publications

References 0 publications

Diagnosis of a periodic nanostructure with a defect using circularly polarized light

Diagnosis of a periodic nanostructure with a defect using circularly polarized light

Ellipsometry of thin films of biological objects under conditions of total internal reflection

Peculiarities of the spectrum of reflected and transmitted light of circular polarization for a thin layer of an anisotropic wurtzite-type crystal near phonon resonance

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