2005
DOI: 10.1238/physica.topical.115a01099
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ELNES Analysis for Silicon, Silicon Oxide and Their Interface

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“…Figure 3 shows an ADF STEM image of the edge of a β-FeSi 2 nanocrystal and corresponding background-subtracted Si L 2,3 edges acquired from the core of the crystal, from the shell region, and from vacuum. The onset of the Si L 2,3 edge in the core of the crystal is at ß99 eV, while in the shell region it is shifted to ß104 eV, in good agreement with the expected onsets of the Si L 2,3 edge of crystalline Si [24] (99 eV) and of amorphous SiO 2 [23] (104.8 eV), in which the tetrahedra formed from Si and O bonds lack long-range order. Thus, the observed shift in the Si edge onset suggests that the shell structure is mostly SiO x .…”
Section: Structural and Chemical Propertiessupporting
confidence: 80%
“…Figure 3 shows an ADF STEM image of the edge of a β-FeSi 2 nanocrystal and corresponding background-subtracted Si L 2,3 edges acquired from the core of the crystal, from the shell region, and from vacuum. The onset of the Si L 2,3 edge in the core of the crystal is at ß99 eV, while in the shell region it is shifted to ß104 eV, in good agreement with the expected onsets of the Si L 2,3 edge of crystalline Si [24] (99 eV) and of amorphous SiO 2 [23] (104.8 eV), in which the tetrahedra formed from Si and O bonds lack long-range order. Thus, the observed shift in the Si edge onset suggests that the shell structure is mostly SiO x .…”
Section: Structural and Chemical Propertiessupporting
confidence: 80%