The combination of chirality and semiconducting properties
has
enabled chiral metal-halide semiconductors (MHS) to be promising candidates
for spin- and polarization-resolved optoelectronic devices. Although
several chiral MHS with rich chemical and structural diversity have
been reported lately, the macroscopic origin of chiroptical activity
remains elusive. Here, combining spectroscopic measurements and Mueller
matrix analysis, we discover that the previously reported “apparent”
anisotropy factor measured from circular dichroism (CD) in chiral
MHS thin films is not an intrinsic chiroptical property, but rather,
arising from an interference between the film’s linear birefringence
(LB) and linear dichroism (LD). We verify the presence of LB and LD
effects in both one-dimensional and zero-dimensional chiral MHS thin
films. We establish spectroscopic methods to decouple the genuine
CD from other spurious contributions, which allows a quantitative
comparison of the intrinsic chiroptical activity across different
chiral MHS. The relationship between the structure and the genuine
chiroptical activity is then uncovered, which is well described by
the chirality-induced spin–orbit coupling in the chiral structures.
Our study unveils the macroscopic origin of chiroptical activity of
chiral MHS and provides design principles for obtaining high anisotropic
factors for future chiral optoelectronic applications.