2018
DOI: 10.1002/adfm.201801808
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Elucidating the Origins of Subgap Tail States and Open‐Circuit Voltage in Methylammonium Lead Triiodide Perovskite Solar Cells

Abstract: Recombination via subgap trap states is considered a limiting factor in the development of organometal halide perovskite solar cells. Here, the impact of active layer crystallinity on the accumulated charge and opencircuit voltage (V oc ) in solar cells based on methylammonium lead triiodide (CH 3 NH 3 PbI 3 , MAPI) is demonstrated. It is shown that MAPI crystallinitycan be systematically tailored by modulating the stoichiometry of the precursor mix, where small quantities of excess methylammonium iodide (MAI)… Show more

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Cited by 91 publications
(96 citation statements)
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“…We note that the effect of excess MAI on device performance was found to be dependent on HTL employed. Using PEDOT:PSS as HTL, excess MAI results in enhanced device V oc, as we have previously reported, whilst with PTAA/PFN excess MAI did not enhance V oc . The origin of this dependence is unclear but may be associated with the differing impact of the HTL on the perovskite film morphology and crystallinity.…”
Section: Resultssupporting
confidence: 76%
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“…We note that the effect of excess MAI on device performance was found to be dependent on HTL employed. Using PEDOT:PSS as HTL, excess MAI results in enhanced device V oc, as we have previously reported, whilst with PTAA/PFN excess MAI did not enhance V oc . The origin of this dependence is unclear but may be associated with the differing impact of the HTL on the perovskite film morphology and crystallinity.…”
Section: Resultssupporting
confidence: 76%
“…Integrating the photoemission signal for energies below the VBE (shaded areas in Figure f) indicate that this trap state density is some 70% larger for MAPbI 3 compared to NMA‐MAPbI 3 (0.25% NMA), providing further evidence that NMA is efficient at trap state passivation. Increased trap state densities have been correlated with lower device V oc , as trapped charge functions as recombination centers reducing quasi‐Fermi level splitting in the perovskite layer . Supporting this correlation, Figure h plots τ 1 (assigned primarily to charge trapping) determined from the perovskite film TCSPC data (Figure e) and device V oc versus NMA concentration.…”
Section: Resultsmentioning
confidence: 66%
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“…The V oc and FF are mainly related to the recombination behavior within the perovskite layer and the interface. The presence of bulk/interface defects would induce severe charge recombination and energy loss . As discussed above, the unavoidable film issues for the pristine NiO NCs film (agglomeration or discontinuity), would increase the defect density in the NiO/perovskite interface, resulting in the unnecessary V oc /FF loss.…”
Section: Resultsmentioning
confidence: 99%
“…An increase in the PL intensity can be seen for both the pure FAI and 75/25 post‐treated films, whereas in the case of an excess of FABr in the dipping solution (including the 50/50 sample), the PL intensity was low compared with the standard film. The decreased PL intensity in the case of an excess of FABr is mainly due to an increase in the nonradiative SRH recombination and the density of traps, which results from the structural distortion in the perovskite lattice …”
Section: Resultsmentioning
confidence: 99%