Embedded Systems Design with FPGAs

Abstract

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Ultradurable Embedded Physically Unclonable Functions

“…This debiasing process was used to generate binary keys for 30 different PUFs (Supporting Information, Figure S2). The key PUF metrics include uniqueness, reliability, uniformity, and randomness . The first parameter evaluated is uniformity (eq S1), which measures the even distribution of 1-bits and 0-bits within the keys.…”