2022
DOI: 10.1049/stg2.12060
|View full text |Cite
|
Sign up to set email alerts
|

EMD/HT‐based local fault detection in DC microgrid clusters

Abstract: DC faults can create serious damages if not detected and isolated in a short time. This paper proposes a fault detection technique for DC faults to enhance the protection of DC microgrid clusters. To detect such faults accurately and quickly, a DC fault detection scheme using empirical mode decomposition and Hilbert transform is proposed. Due to the strict time limits for fault interruption caused by fast high‐rising fault currents in DC systems, DC microgrid clusters' protection remains a challenging task. Fu… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2022
2022
2025
2025

Publication Types

Select...
4
3
1

Relationship

0
8

Authors

Journals

citations
Cited by 17 publications
(3 citation statements)
references
References 37 publications
0
3
0
Order By: Relevance
“…Load responsiveness in the context of the IoE equipped with monitoring techniques will be better and thus the benefits of energy conservation will be higher. In fact, load response can support access to various distributed smart devices, thus allowing end prosumers to implement active performance in actual time [22,23]. The IoE is a SG in which the multidimensional flow of different types of information and energy is realised by the Internet.…”
Section: The Connection Between Sg and Ioementioning
confidence: 99%
“…Load responsiveness in the context of the IoE equipped with monitoring techniques will be better and thus the benefits of energy conservation will be higher. In fact, load response can support access to various distributed smart devices, thus allowing end prosumers to implement active performance in actual time [22,23]. The IoE is a SG in which the multidimensional flow of different types of information and energy is realised by the Internet.…”
Section: The Connection Between Sg and Ioementioning
confidence: 99%
“…During a fault, the presence of a DC decaying component is prominent in the faulty phase, then a significant TI can be found in the faulty phase. To calculate a suitable TI threshold for detecting fault events, the largest value of TI is calculated for the largest overload condition, normally 120% of rated current [20]. Therefore, to distinguish the faulty and overload events, the following constraint should be satisfied…”
Section: Fault Detection Techniquementioning
confidence: 99%
“…In [30], a hierarchical clustering analysis for identifying electrical battery vehicles (BEVs) is presented to collect demand clusters. Also, the charging demands of these clusters have been accomplished by establishing a model for assigning a BEV charging station [31]. However, the capacity of the charging station has not been considered in the proposed model.…”
Section: Introductionmentioning
confidence: 99%