“…To evaluate the dielectric relaxation characteristic of ε ″ around room temperature, the Vogel–Fulcher fitting is performed using the following formula where f is the measurement frequency, f 0 is the attempt frequency, E a is the activation energy, k is the Boltzmann constant, T m is the temperature corresponding to the maximum ε ″ near T O–T or T R–O&O–T , and T VF is the freezing temperature. , Interestingly, the relaxation behavior of ε ″ at T O–T or T R–O&O–T is well-fitted via the Vogel–Fulcher law for the ceramics with x = 0.04–0.08 (Figure b1–b4 and S5b). Here, the dielectric relaxation behavior occurs far below T C , suggesting a re-entrant-like relaxation. , In particular, here, the re-entrant-like relaxation behavior coexists with the FFP transition (i.e., the multiphase coexistence region) where the lattice is susceptible to the external stimuli (e.g., electric field, temperature, and stress) due to the flexible polarization rotation among different ferroelectric phases, differing from the situation of typical re-entrant relaxors. , …”