EMI Radiated Noise Measurement System Using the Source Reconstruction Technique

Hernando, M.M.; Fernández, A.; Arias, Manuel; Rodriguez, M.; Álvarez, Yuri; Las-Heras, Fernando

doi:10.1109/tie.2008.928042

Cited by 50 publications

(19 citation statements)

References 14 publications

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“…(1) and (2), H x , H y , (x, y, z), (x', y', z'), and R are known, but J x and J y are unknown. The technique to find J x and J y are called the source-reconstruction method [3]- [4]. Since the field H x or H y are detected at discrete positions, the source surface S' and detection surface S can be sub-divided as equal to the scanned spacing and points.…”

Section: A Source Reconstructionmentioning

confidence: 99%

“…This means that one can calculate the far-field at the finite distance from the source as well as the near-field placed closely to the source. The conventional method for near-field to near-/far-field transformation has been performed in the free-space condition [4]- [5], which corresponds to the anechoic chamber situation. It worked very well.…”

Section: B Composite Array Source and Transformationmentioning

confidence: 99%

“…It worked very well. However, the situation for EMC test at low frequency is for the grounded anechoic chamber, so called, semi-anechoic chamber , and therefore, the previous work [4]- [5] cannot be applied.…”

Section: B Composite Array Source and Transformationmentioning

confidence: 99%

See 2 more Smart Citations

Reactive near-field to near-/far-field transformation in semi-anechoic chamber

Lee

Jeon

et al. 2013

2013 Asia-Pacific Microwave Conference Proceedings (APMC)

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In this paper, the technique of the reactive nearfield to near-/far-field transformation has been proposed. The different thing compared with the previous work is that the environment of the semi-anechoic chamber with the ground plane was assumed during the transformation. The sources of electronic device are reconstructed from the detected reactive near-field. And then, the composite array source using the image theory is built, and then the transformation from the composite source to the near-/far-field are performed. For the verification, the simulated results have been utilized, and their results show small errors. Therefore, the proposed technique in this paper could be applied to predict the radiated field at 3 m or 10 m without the expensive large semi-anechoic chamber.

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Section: A Source Reconstructionmentioning

confidence: 99%

Section: B Composite Array Source and Transformationmentioning

confidence: 99%

See 1 more Smart Citation

Reactive near-field to near-/far-field transformation in semi-anechoic chamber

Lee

Jeon

et al. 2013

2013 Asia-Pacific Microwave Conference Proceedings (APMC)

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“…Far-field radiated emission prediction from PCBs based on near-field measurement has been studied using different approaches in the literatures [5]- [10]. For instance, equivalent magnetic/electric currents were used to model the radiated emission sources from a PCB in [5]- [7], where the equivalent currents were retrieved by solving a set of integral equations relating the currents and the near-field distributions.…”

Section: Introductionmentioning

confidence: 99%

A Particle Swarm Optimization-Based Approach for Predicting Maximum Radiated Emission From PCBs With Dominant Radiators

Xiang

Wei

et al. 2015

IEEE Trans. Electromagn. Compat.

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In this paper, an approach is proposed to predict the maximum far-field radiated emission based on phaseless near-field scanning. The maximum radiated emission from printed circuit boards is assumed to be produced by dominant magnetic dipoles located by the near-field measurement. The particle swarm optimization technique is then employed to identify the complex moment components of the dipoles. Once the dominant dipoles at each emission frequency are determined, the maximum far-field radiated emission in the interested frequency range can be calculated using the method of moments. The proposed approach allows a quick assessment of far-field radiated emission precompliance in a wide frequency range by near-field scanning. Experimental results are presented to show its feasibility and effectiveness.Index Terms-Maximum radiated emission, method of moments, near-field scanning, particle swarm optimization, printed circuit boards.

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“…The results obtained are then used in a simulation platform to help developers in their design by taking into account these EMC strains. It can also be used to detect EM sources, to predict the EM radiated field by the DUT and to evaluate the EMI (ElectroMagnetic Interference) with other devices [5,6].…”

Section: Introductionmentioning

confidence: 99%

Improvement of Electrical Near-Field Measurements With an Electro-Optic Test Bench

David¹,

Baudry²,

Louis³

2012

PIER B

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Abstract-In this paper, two different kinds of near-field measurement techniques are presented. The first one uses coaxial probes that do not give precise measurements on microelectronic devices. We saw in [1] that the spatial resolution of these probes reaches 500 µm for monopole and is millimetric for dipole probe. The second one is based on the Pockels effect that converts an electromagnetic (EM) field into optical modulation. Our objective is to improve the E x /E y near-field measurement with this second technique. The performance of the electro-optic (EO) probe is compared with dipole probes of 2.5 and 5 mm with the use of simulations and measurements, on a wire above a ground plane and on coupled microstrip lines. At the end, a discussion about the technical limitations of the EO probe is made.

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EMI Radiated Noise Measurement System Using the Source Reconstruction Technique

Cited by 50 publications

References 14 publications

Reactive near-field to near-/far-field transformation in semi-anechoic chamber

Reactive near-field to near-/far-field transformation in semi-anechoic chamber

A Particle Swarm Optimization-Based Approach for Predicting Maximum Radiated Emission From PCBs With Dominant Radiators

Improvement of Electrical Near-Field Measurements With an Electro-Optic Test Bench

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