2016 IEEE 37th International Electronics Manufacturing Technology (IEMT) &Amp; 18th Electronics Materials and Packaging (EMAP) 2016
DOI: 10.1109/iemt.2016.7761978
|View full text |Cite
|
Sign up to set email alerts
|

EMI shielding performance by metal plating on mold compound

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
7
0

Year Published

2019
2019
2024
2024

Publication Types

Select...
4
2

Relationship

0
6

Authors

Journals

citations
Cited by 6 publications
(7 citation statements)
references
References 0 publications
0
7
0
Order By: Relevance
“…Therefore, the shielding of electromagnetic waves can be represented by the sum of reflection ( ), absorption ( ), and multiple reflections ( ) loss of materials i.e., SE = [ 65 , 66 , 67 ]. In this case, can be ignored [ 7 , 68 ] if is greater than 9 dB. Therefore, and can be derived by Simon formalism [ 69 , 70 ]: where is the volume resistivity (Ω∙cm), which is the same as the reciprocal of the electrical conductivity ( σ ), f is the frequency (MHz), and t is the thickness of the shielding material (cm).…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Therefore, the shielding of electromagnetic waves can be represented by the sum of reflection ( ), absorption ( ), and multiple reflections ( ) loss of materials i.e., SE = [ 65 , 66 , 67 ]. In this case, can be ignored [ 7 , 68 ] if is greater than 9 dB. Therefore, and can be derived by Simon formalism [ 69 , 70 ]: where is the volume resistivity (Ω∙cm), which is the same as the reciprocal of the electrical conductivity ( σ ), f is the frequency (MHz), and t is the thickness of the shielding material (cm).…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, the shielding of electromagnetic waves can be represented by the sum of reflection (SE R ), absorption (SE A ), and multiple reflections (SE M ) loss of materials i.e., SE = SE R + SE A + SE M [65][66][67]. In this case, SE M can be ignored [7,68] if SE R is greater than 9 dB. Therefore, SE R and SE A can be derived by Simon formalism [69,70]:…”
Section: Shielding Effectiveness Measurementmentioning
confidence: 99%
“…A shielded metal lid was traditionally used to block EMI radiation from device to device. Furthermore, conformal shielding will be a more effective method to decrease the EMI, because it has a smaller size and a lighter weight than a shielding cover [10][11][12][13][14][15][16][17][18][19]. Some novel shielding structures were applied to packages based on conformal shielding technology [20,21].…”
Section: Introductionmentioning
confidence: 99%
“…The second is the absorption loss, which occurs in low density, thin matching thickness, high complex permittivity values along with high conductivity, as well as magnetic materials where the electromagnetic waves pass through the shielding material and are converted into heat via ohmic loss. The third is multireflection loss, caused by electromagnetic waves propagating in a completely different direction through the materials that cannot be penetrated due to the retro-reflection or electromagnetic scattering into the shielding materials [11,12].…”
Section: Introductionmentioning
confidence: 99%
“…Due to the conducting nature of metals, the absorption of shielding materials is greater and the chances to bounce back the waves are less. Thus, the multireflection loss (B) between two surfaces of the metal materials is very low and can be neglected [11,12]. Absorption loss in metals can be expressed using Equation (2) as follows: A = 0.085t fµ r σ r [dB] (2)…”
Section: Introductionmentioning
confidence: 99%