2019 IEEE Wireless Power Transfer Conference (WPTC) 2019
DOI: 10.1109/wptc45513.2019.9055652
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EMI Suppression of MEMS Honeycomb-Shaped Inductor on Oscillators for Wireless-Powered IC Design

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(2 citation statements)
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“…Most of them are related with individual devices. See, for example, the published work of Kantartzis, 8 Chen et al, 9 Jmai et al, 10 Kong et al, 11 Nevlyudov et al, 12 and Wu et al 13 There is a relevant publication from Monti et al, 14 which is a more general and good review of the state of the art of EMI-EMC problems in MEMS. Monti et al highlighted several important points: the differences between near-field and far-field coupling in WPT technologies, the problems related to human exposure to electromagnetic radiation, the need to consider both wireless energy and data transfer, effects over digital and analog circuits, several theoretical and numerical approaches to model the link budget and a pair of illustrative examples.…”
Section: Study Of Electromagnetic Interference and Compatibility Issuesmentioning
confidence: 99%
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“…Most of them are related with individual devices. See, for example, the published work of Kantartzis, 8 Chen et al, 9 Jmai et al, 10 Kong et al, 11 Nevlyudov et al, 12 and Wu et al 13 There is a relevant publication from Monti et al, 14 which is a more general and good review of the state of the art of EMI-EMC problems in MEMS. Monti et al highlighted several important points: the differences between near-field and far-field coupling in WPT technologies, the problems related to human exposure to electromagnetic radiation, the need to consider both wireless energy and data transfer, effects over digital and analog circuits, several theoretical and numerical approaches to model the link budget and a pair of illustrative examples.…”
Section: Study Of Electromagnetic Interference and Compatibility Issuesmentioning
confidence: 99%
“…Most of them are related with individual devices. See, for example, the published work of Kantartzis, 8 Chen et al., 9 Jmai et al., 10 Kong et al., 11 Nevlyudov et al., 12 and Wu et al 13 . There is a relevant publication from Monti et al., 14 which is a more general and good review of the state of the art of EMI—EMC problems in MEMS.…”
Section: Introductionmentioning
confidence: 99%