CAS 2010 Proceedings (International Semiconductor Conference) 2010
DOI: 10.1109/smicnd.2010.5650229
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Emission efficiency of crystalline and amorphous Si nanoclusters

Abstract: The paper presents the results of emission efficiency comparison in crystalline and amorphous Si nanoclustes. Using X-ray diffraction (XRD) and photoluminescence (PL) methods the correlation between different PL bands and the volumes of Si nanocrystals and an amorphous (a-Si:H) phase have been revealed The size parameters of amorphous (a-Si:H) nanoclusters (quantum dots) and Si nanocrystals have been estimated from PL study and have been compared in the last case with that obtained by the XRD method. Using PL … Show more

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