1988
DOI: 10.1063/1.1140239
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Emissive probe current bias method of measuring dc vacuum potential

Abstract: Effective electric field in dc magnetization measurements: Comparing magnetization to transport critical currents

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Cited by 47 publications
(29 citation statements)
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“…The Langmuir probe is used to determine n 0 , T e , and φ p . The emissive probe is used to measure the local potential as a function of position in the chamber [ Diebold et al , 1988]. These measurements provide the vertical potential profile in the sheath, φ s ( z ).…”
Section: Resultsmentioning
confidence: 99%
“…The Langmuir probe is used to determine n 0 , T e , and φ p . The emissive probe is used to measure the local potential as a function of position in the chamber [ Diebold et al , 1988]. These measurements provide the vertical potential profile in the sheath, φ s ( z ).…”
Section: Resultsmentioning
confidence: 99%
“…Standard references for the construction and operation of these probes suggest a probe radius of 12.7 μm, a probe length of 5 mm, and an emission current of 50 μA [14], [15]. If an operating temperature of 2000 K is assumed, the electron density at the probe surface is 1.1 × 10 10 cm −3 when the virtual cathode returns all the emitted electrons.…”
Section: Introductionmentioning
confidence: 99%
“…The plate was 25 cm in diameter and 60 cm from the filament. The potential profiles in the sheaths were measured with an emissive probe [ Diebold et al , ], which was made of a thoriated tungsten wire 3 mm long and 0.025 mm in diameter. The electron emission from the emissive probe was small to avoid the influence to the sheath potentials.…”
Section: Methodsmentioning
confidence: 99%