Empirical Emission Eigenmodes of Printed Circuit Boards

Arnaut, Luk R.; Obiekezie, C. S.; Thomas, D.W.P.

doi:10.1109/temc.2013.2292548

Cited by 16 publications

(14 citation statements)

References 21 publications

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“…Even if it is quite difficult to precisely separate random parameters, we may propose to reduce the models to the two interacting variables: P and f. The Fig.5-B show the results obtained considering in relation (1). In comparison with Fig.4, the mean and standard deviation of S 12 fit very well, justifying the lower impact of RV1.…”

Section: From Sensitivity Analysis To Multi-rv Model Reductionmentioning

confidence: 85%

“…In accordance with standards, this mainly sets two problems: the need for precise and efficient tools to quantify more realistic EMC margins, jointly with trustworthy reliability levels. Non-exhaustive stateof-the-art EMC stochastic issues contain different philosophies to integrate this problem for instance involving Printed Circuit Boards (PCBs) [1], cable coupling [2][3] and effects of uncertain High Intensity Radiated Fields (HIRFs) [3].…”

Section: Physical and Industrial Contextsmentioning

confidence: 99%

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Paradigm of sensitivity analysis in EMC stochastic enclosed environments

Lalléchère

Girard

Slama

et al. 2014

2014 XXXIth URSI General Assembly and Scientific Symposium (URSI GASS)

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The aim of this contribution is to present a whole experimental methodology to assess the effects of uncertainties for a classical EMC issue. To this end, a cabinet was designed and achieved with controlled geometrical parameters including moving external slot and internal plate, an inner rotating unit embedded with stirrer and cable. From industrial expectations, the experimental setup and the theoretical basis will be described briefly. Then, the validation (convergence, accuracy and robustness) of the proposed stochastic methods will be obtained facing Monte Carlo (MC) measurements including three random parameters. Finally, the combination of stochastic techniques with sensitivity study will improve the global process. Physical and industrial contextsIn the ElectroMagnetic Compatibility (EMC) literature, designing electronic large systems is mostly based upon "worst" cases approaches. In accordance with standards, this mainly sets two problems: the need for precise and efficient tools to quantify more realistic EMC margins, jointly with trustworthy reliability levels. Non-exhaustive stateof-the-art EMC stochastic issues contain different philosophies to integrate this problem for instance involving Printed Circuit Boards (PCBs) [1], cable coupling [2-3] and effects of uncertain High Intensity Radiated Fields (HIRFs) [3]. Materials and methods Overview of stochastic measurements setupsThe study presented in [4] detailed the design and achievement of a box including different geometrical parameters acting as Random Variables (RV). The governing idea was to manufacture a device providing mechanically various and precise configurations of the equipment. This allows defining different EMC classical setups involving different devices and outputs. Indeed, as depicted respectively in Fig.2-A and Fig.3-A, slots and inner volume modifications are allowed, and a rotating unit enables modifications around the location of different equipment (cable for instance). First, a spectrum analyzer Anritsu MS 2663C (bandwidth 9kHz-3GHz) has been used for power measurement ( Figure 2). Then, S 12 parameter (Figures 1 and 2) between emission and reception antennas is measured by a network analyzer Rohde & Schwarz ZVB 8 (bandwidth 300kHz-8GHz). A common strategy has been defined since the measurements were achieved in one go (no break); this has required a whole automation of the process (especially for MC treatments). Due to the similarity of the MC and Stochastic Collocation (SC) approaches (details in section 2.2), the statistical treatments required only to use the chosen points from this database. Stochastic theory and sensitivity analysis needsAccording to the SC foundations [4], the technique is close to MC philosophy since it only requires a smart sampling of input data and to straightforward apply the deterministic setup (numerical and/or experimental) from this set of points. The theoretical details and some chosen examples of SC weighted points sets may be found in [5] where the limitations of the method were presented. Du...

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Section: From Sensitivity Analysis To Multi-rv Model Reductionmentioning

confidence: 85%

Section: Physical and Industrial Contextsmentioning

confidence: 99%

Paradigm of sensitivity analysis in EMC stochastic enclosed environments

Lalléchère

Girard

Slama

et al. 2014

2014 XXXIth URSI General Assembly and Scientific Symposium (URSI GASS)

View full text Add to dashboard Cite

show abstract

“…Information about these sources can be obtained via Near-Field Scanning (NFS); the focus has been here in practice mainly on obtaining field emissions from time harmonic and deterministic sources [3], [4], [5]. Measuring the radiated emissions from PCBs has been used to study the electromagnetic fields in regions surrounding integrated circuits (ICs) [6], to estimate the currents flowing through chips [7], and to extract effective dipole moments for source reconstruction [8], [9], [10], [11], [12], [13].…”

Section: Introductionmentioning

confidence: 99%

“…In [16] the ACF of the near field is expanded in eigenmodes through the KarhunenLoève theorem, and each eigenvalue is propagated by using the canonical NFF transformations. A similar approach has been revisited and expanded in view of the Principal and Independent Component Analyses (PCA, ICA) for the field radiated by Ultra Wide Band (UWB) sources [23], [13], [24], [25]. In [26], the ACF approach has been used in source reconstruction and localisation.…”

Section: Introductionmentioning

confidence: 99%

Wigner-Function-Based Propagation of Stochastic Field Emissions From Planar Electromagnetic Sources

Gradoni

Arnaut

Creagh

et al. 2018

IEEE Trans. Electromagn. Compat.

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A note on versions:The version presented here may differ from the published version or from the version of record. If you wish to cite this item you are advised to consult the publisher's version. Please see the repository url above for details on accessing the published version and note that access may require a subscription. Abstract-Modelling the electromagnetic radiation from modern digital systems -acting effectively as extended, stochastic sources as part of a complex architecture -is a challenging task. We follow an approach here based on measuring and propagating field-field autocorrelation functions (ACFs) after suitable averaging. From the modelling side, we use the Wigner transform of the ACFs to describe random wave fields in terms of position and direction of propagation variables. An approximate propagator for the components of the radiated magnetic field is constructed for these ACFs based on a linear flow map. Field-field ACFs at aperture level are obtained from scanning measurements of complex sources. Distance and spatial resolution of the scanning plane is less than a wavelength from the source plane to capture the imprint of evanescent waves in the nearfield ACFs. Near-field scanning and efficient near-to-far field propagation is carried out and compared with measurements. Results of this study will be useful to assist far-field predictions, source reconstruction, and emission source microscopy.

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“…Stochastic techniques offer a powerful framework for identifying and separating UWB sources because increasing the number of observation frequencies increases the accuracy with which such sources can then be characterized and grouped. In [4], principal component analysis (PCA) was used to decorrelate and identify dominant emissions across the band. By decomposing a measured UWB field scan, spatial maps of uncorrelated/orthogonal basis fields (empirical eigenmodes) were extracted.…”

Section: Introductionmentioning

confidence: 99%

Source Separation for Wideband Energy Emissions Using Complex Independent Component Analysis

Arnaut

Obiekezie

2014

IEEE Trans. Electromagn. Compat.

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Complex independent component analysis is formulated for ultrawideband (UWB) incoherent fields, based on maximum-likelihood estimation with iterative natural gradient searching. It can be applied to measurements of complex power separated in contributions by propagating and reactive near-fields. A set of novel nonlinear asymmetric score functions is derived that are asymptotically matched to skewed probability density functions of incoherent energy sources departing from ideal chi-square ensemble distributions. The source decomposition is applied to two analog and digital integrated circuits. Based on the measured intensity of the emitted magnetic field, the technique is shown to enable nonlinear extraction of a set of independent spatially separated UWB sources, without knowledge of neither the detailed circuit geometry nor its on-board signals. Overcompleteness of the data set is found to have a relatively small effect on the accuracy of the estimated magnitude and location of the emission hot spots, but has a major influence on the global spatial maps and nature of the extracted sources. Index Terms-Blind deconvolution, blind source separation, complex independent component analysis, electromagnetic interference, maximum-likelihood estimation (MLE), radiated emissions.0018-9375

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Empirical Emission Eigenmodes of Printed Circuit Boards

Cited by 16 publications

References 21 publications

Paradigm of sensitivity analysis in EMC stochastic enclosed environments

Paradigm of sensitivity analysis in EMC stochastic enclosed environments

Wigner-Function-Based Propagation of Stochastic Field Emissions From Planar Electromagnetic Sources

Source Separation for Wideband Energy Emissions Using Complex Independent Component Analysis

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