17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings.
DOI: 10.1109/dftvs.2002.1173533
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Emulation-based design errors identification

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Cited by 3 publications
(2 citation statements)
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“…Existing simulated FI techniques are based on saboteurs, mutants or simulation command-based approach [1]. SystemC-based FI techniques using emulation approach (such as [8]) is outside the scope of this paper due to our focus on simulated FI approach. In the following, existing simulated FI techniques are described.…”
Section: Existing Fault Injection Techniquesmentioning
confidence: 99%
“…Existing simulated FI techniques are based on saboteurs, mutants or simulation command-based approach [1]. SystemC-based FI techniques using emulation approach (such as [8]) is outside the scope of this paper due to our focus on simulated FI approach. In the following, existing simulated FI techniques are described.…”
Section: Existing Fault Injection Techniquesmentioning
confidence: 99%
“…An application programmable interface (API) for one of the most advanced hardware emulator has been developed [11]. It allows to load the emulator memory board and to sample the DUT primary outputs from the emulator equipment.…”
Section: Hardware Emulator Interfacementioning
confidence: 99%