Owing
to their large surface area, continuous conduction paths,
high activity, and pronounced anisotropy, nanowires are pivotal for
a wide range of applications, yet far from thermodynamic equilibrium.
Their susceptibility toward degradation necessitates an in-depth understanding
of the underlying failure mechanisms to ensure reliable performance
under operating conditions. In this study, we present an in-depth
analysis of the thermally triggered Plateau–Rayleigh-like morphological
instabilities of electrodeposited, polycrystalline, 20–40 nm
thin platinum nanowires using in situ transmission
electron microscopy in a controlled temperature regime, ranging from
25 to 1100 °C. Nanowire disintegration is heavily governed by
defects, while the initially present, frequent but small thickness
variations do not play an important role and are overridden later
during reshaping. Changes of the exterior wire morphology are preceded
by shifts in the internal nanostructure, including grain boundary
straightening, grain growth, and the formation of faceted voids. Surprisingly,
the nanowires segregate into two domain types, one being single-crystalline
and essentially void-free, while the other preserves void-pinned grain
boundaries. While the single-crystalline domains exhibit fast Pt transport,
the void-containing domains are unexpectedly stable, accumulate platinum
by surface diffusion, and act as nuclei for the subsequent nanowire
splitting. This study highlights the vital role of defects in Plateau–Rayleigh-like
thermal transformations, whose evolution not only accompanies but
guides the wire reshaping. Thus, defects represent strong parameters
for controlling the nanowire decay and must be considered for devising
accurate models and simulations.