2019
DOI: 10.4071/2380-4491-2019-dpc-presentation_tp3_004
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ENEPIG Reliability - Enhancement by Simple Drop in Process Changes

Abstract: Soldering on ball grid arrays (BGAs) and dense circuit features is standard practice in the microelectronics industry. Key to the success of this operation is solder joint reliability (SJR). The evaluation of solder joint reliability can be satisfied by high speed shear testing (HSS). HSS testing in combination with representative test vehicles are tools that can be used to gain statistical data in order to evaluate the impact of controlled testing. During such a round of controlled testing in the context of a… Show more

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