2019
DOI: 10.1017/s1431927619009723
|View full text |Cite
|
Sign up to set email alerts
|

Energy Dispersive X-ray Spectroscopic Analysis of Al-Cu-Fe Quasicrystalline Thin Film Layer

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2020
2020
2022
2022

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 3 publications
0
1
0
Order By: Relevance
“…(20). The other elements noticed (Au, Si, Al and Cl) refer to the elements in standard in analysis device (21)(22), and the other components (K, Ca and Na) are additives to improve properties of polymer.…”
Section: Resultsmentioning
confidence: 99%
“…(20). The other elements noticed (Au, Si, Al and Cl) refer to the elements in standard in analysis device (21)(22), and the other components (K, Ca and Na) are additives to improve properties of polymer.…”
Section: Resultsmentioning
confidence: 99%