2021
DOI: 10.1021/acs.jpcc.0c08491
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Energy Storage and Leakage Current Characteristics of Low-Temperature-Derived Pb0.8La0.1Ca0.1Ti0.975O3 Thin Films Tailored by an Annealing Atmosphere

Abstract: Sol−gel-derived (100)-textured Pb 0.8 La 0.1 Ca 0.1 Ti 0.975 O 3 (PLCT) thin films were prepared on Pt/Ti/SiO 2 /Si(100) substrates at a low temperature of 450 °C. Modification of annealing atmospheres, i.e., O 2 , air, and N 2 , on the electrical properties of PLCT thin films was focused on in this work, especially the energy storage and leakage current characteristics. In contrast to some secondary phases, such as PbO x and pyrochlore phase, detected in the PLCT films annealed in air and N 2 , a phase-pure P… Show more

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Cited by 8 publications
(8 citation statements)
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“…High energy storage density depends on low P r and narrow P–E loops. Generally, the value of energy storage density can be calculated from P–E loops with the following equation. , W normalr normale normalc = prefix∫ P normalr P normalm E normald P where W rec is energy storage density, and E is the electric field of dielectric materials. Figure b shows the W rec and efficiency (η) of the PZT/STO superlattices and PZT films at different electric fields.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…High energy storage density depends on low P r and narrow P–E loops. Generally, the value of energy storage density can be calculated from P–E loops with the following equation. , W normalr normale normalc = prefix∫ P normalr P normalm E normald P where W rec is energy storage density, and E is the electric field of dielectric materials. Figure b shows the W rec and efficiency (η) of the PZT/STO superlattices and PZT films at different electric fields.…”
Section: Resultsmentioning
confidence: 99%
“…Generally, the value of energy storage density can be calculated from P−E loops with the following equation. 25,26 = W E P d…”
mentioning
confidence: 99%
“…Oxygen vacancies in ferroelectric films can generate conductive electrons according to the following equation: 15,26…”
Section: Resultsmentioning
confidence: 99%
“…Oxygen vacancies in ferroelectric films can generate conductive electrons according to the following equation: 15,26 which can cause a sharp increase in film leakage current. Annealing in an oxygen-rich atmosphere can move the above equation that generates oxygen vacancies in the opposite direction, compensating for the generation of oxygen vacancies.…”
Section: Resultsmentioning
confidence: 99%
“…According to the above discussion, a ferroelectric film with superior energy storage capacity should feature a tilted and elongated P-E loop, i.e., a large maximum polarization (P m ) while a small remnant one (P r ) and a high breakdown strength (E b ). To this day, many strategies involving the material engineering from the nanoscale up have been used to modify P-E characteristics of a ferroelectric film for capacitive energy storage, including chemical modification with specific dopants/defects [1,[9][10][11][12][13][14], polymorphic domain/ morphotropic phase boundary (MPB) regulation [1,[15][16][17][18][19][20][21], compositing with a nanoscale-dispersed second phase [22][23][24], engineering a fine-grain structure [25][26][27], construction of multilayers/superlattices based on interface & strain effects [28][29][30][31][32][33][34][35][36]. Under these efforts (to produce higher polarization, higher applicable electric field, lower loss, or combination of them), the recoverable energy density (W rec ) of ferroelectric films have been rapidly increased to a level of 10-100 J/cm 3 , a boost of 1-2 orders of magnitude as compared with those of their bulk counterparts.…”
Section: Introductionmentioning
confidence: 99%