2009
DOI: 10.1063/1.3267162
|View full text |Cite
|
Sign up to set email alerts
|

Enhance diamond coating adhesion by oriented interlayer microcracking

Abstract: In this paper, we report a microcrack toughening mechanism for enhancing the adhesion of diamond coating. The oriented microcracks were formed within the TiC interlayer to dissipate strain energy and accommodate deformation via the crack opening-closing mechanism, thus enhancing the coating/substrate interfacial toughness. The delamination of diamond coating was effectively prevented when the parallel microcracks were confined within the interlayer and arrested at interfaces of coating/interlayer/substrate. De… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2011
2011
2021
2021

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 27 publications
0
2
0
Order By: Relevance
“…Figure 7 summarizes the work of adhesion values calculated using the simplified Laugier model as a function of adhesion layer composition and compared to the NCD coating deposited on the bare Si wafer (grey line, labeled 'none'). Despite numerous simplifications, the obtained adhesion energies appear to be a reasonable order of magnitude [46].…”
Section: Discussionmentioning
confidence: 85%
See 1 more Smart Citation
“…Figure 7 summarizes the work of adhesion values calculated using the simplified Laugier model as a function of adhesion layer composition and compared to the NCD coating deposited on the bare Si wafer (grey line, labeled 'none'). Despite numerous simplifications, the obtained adhesion energies appear to be a reasonable order of magnitude [46].…”
Section: Discussionmentioning
confidence: 85%
“…Figure 7 summarizes the work of adhesion values calculated using the simplified Laugier model as a function of adhesion layer composition and compared to the NCD coating deposited on the bare Si wafer (grey line, labeled 'none'). Despite numerous simplifications, the obtained adhesion energies appear to be a reasonable order of magnitude [46]. Since scratch testing is highly dependent on the morphology of each surface, and on the coefficient of friction (COF) value between the two bodies (thin film and indenter tip) [18,22], it is important to use an appropriate value when attempting to quantify the adhesion energy (Equation ( 1)).…”
Section: Discussionmentioning
confidence: 99%