2011
DOI: 10.1021/am200460c
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Enhanced Capacitance of Composite Anodic ZrO2 Films Comprising High Permittivity Oxide Nanocrystals and Highly Resistive Amorphous Oxide Matrix

Abstract: Anodic oxide films with nanocrystalline tetragonal ZrO 2 precipitated in an amorphous oxide matrix were formed on Zr-Si and Zr-Al alloys and had significantly enhanced capacitance in comparison with those formed on zirconium metal. The capacitance enhancement was associated with the formation of a high-temperature stable tetragonal ZrO 2 phase with high relative permittivity as well as increased ionic resistivity, which reduces the thickness of anodic oxide films at a certain formation voltage. However, 2 ther… Show more

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Cited by 17 publications
(18 citation statements)
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“…The thickness of the anodic oxide film is 125 ± 3 nm, corresponding to the formation ratio of 2.50 ± 0.06 nm V -1 . This ratio on the Zr-24 at% Ti alloy is slightly smaller than that on Zr (2.70 nm V -1 ) [36]. The reduction of film thickness by the addition of Ti is consistent with a previous study [33].…”
Section: Methodssupporting
confidence: 92%
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“…The thickness of the anodic oxide film is 125 ± 3 nm, corresponding to the formation ratio of 2.50 ± 0.06 nm V -1 . This ratio on the Zr-24 at% Ti alloy is slightly smaller than that on Zr (2.70 nm V -1 ) [36]. The reduction of film thickness by the addition of Ti is consistent with a previous study [33].…”
Section: Methodssupporting
confidence: 92%
“…However, the capacitance value became nearly twice that on Ta after heat treatment, while the tan δ value was as low as that on Ta. The increased capacitance of the anodic oxide film on the oxygen-incorporated Zr-Ti alloy after heat treatment in comparison with that on the as-deposited, oxygen-free alloy may be related to the preferential formation of t-ZrO 2 phase, which has much higher permittivity in comparison with m-ZrO 2 [36].…”
Section: Resultsmentioning
confidence: 99%
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“…The experimentally determined apparent permittivity of the PAA‐inbuilt films (ε = 11) is lower relative to anodic ZrO 2 (ε = 22) and larger relative to anodic Al 2 O 3 (ε = 9) reported in the literature. [ 47,48 ]…”
Section: Resultsmentioning
confidence: 99%
“…The dielectric constant of Gd 2 O 3 can be further used to modify the dielectric behaviour of aluminium-based alloys. The dielectric constant is one of the factors responsible for capacitance enhancement, and portable electronic devices have increased the demand for small-size electrolytic capacitors with high capacitance, low equivalent series resistance, and low leakage current [29,30]. Materials with high dielectric constants are also crucial in many areas of modern microelectronics for miniature supercapacitors, infrared detectors, radar absorbing coatings, and holographic devices.…”
Section: Introductionmentioning
confidence: 99%