Multiple-stage
interband cascade infrared photodetector (ICIP)
is a new class of semiconductor infrared photodetector that exhibits
improved device performance in terms of responsivity and detectivity.
The design of the device structure and the electronic structure on
superlattices and quantum wells assume abrupt interfaces. However,
the emergence of possible interface segregation and atom exchange
can
only be determined experimentally, impacting the device performance.
In this work, the interface atom intermixing and their effects on
the energy band structure in a molecular beam epitaxy grown ICIP are
studied. Scanning transmission electron microscopy (STEM) reveals
atom diffusion and intermixing between the constituent layers of the
cascade structure, causing a shift in the quantum state energy levels
of the layers and the consequent misalignment of the cascade structures.
Combining the STEM observation with high-resolution X-ray diffraction,
the alloy composition profiles of the layers are determined. Using
the “real” graded composition profiles, the effective
band gap of the superlattice absorber and the energy levels of the
relaxation region and the tunneling region are recalculated showing
a cutoff wavelength of the superlattice absorber 4.93 μm, which
is 0.78 μm smaller than that calculated using the nominal step
composition profile. However, its agreement is greatly improved with
the measured cutoff wavelength of 5.03 μm. The energy level
of the narrowest quantum well in the relaxation region is 0.091 eV
higher than the conduction miniband of the absorber, which is also
consistent with the experiments that the pho-response exits a “turn
on” voltage of 0.1 V. The results reported here will help optimize
the energy structure design of future ICIP with improved device performance.