Enhanced effects with scanning force microscopy

Howells, S.; Chen, T.; Gallagher, Mary E.; Yi, L.; Sarid, Dror

doi:10.1063/1.347586

Cited by 7 publications

(4 citation statements)

References 6 publications

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“…In regions where it is small, usually far from the sample, an amplification of lateral forces was observed. This agrees with an earlier report about the influence of electrostatic forces when the cantilever spring constant is small (Howells et al, 1991). The spring constant applied in the present measurements was 0.37 N/m.…”

Section: Introductionsupporting

confidence: 94%

Structural Investigation of Hydrous TiO₂ Precipitates and Their Aging Products by X-ray Diffraction, Atomic Force Microscopy, and Transmission Electron Microscopy

Jalava

Heikkilä

Hovi

et al. 1998

Ind. Eng. Chem. Res.

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The structure of TiO2 hydrates is studied by X-ray diffraction, atomic force microscopy (AFM), and transmission electron microscopy (TEM). The samples prepared by NH4OH precipitation from an aqueous TiCl4 solution are amorphous or partially crystalline. They consist of a mixture of distorted anatase and brookite crystallites, each having a diameter of 20 nm. The sample prepared by thermal hydrolysis from a titanium oxide sulfate solution was totally crystalline, composed only of distorted anatase crystallites with a diameter of 15 nm. Primary particles can be oriented in chainlike structures. The crystallinity and the crystal shape reveal the sample history. The applicability of the AFM and TEM measurements for structural investigations of the powder specimens concerned is briefly discussed.

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Section: Introductionsupporting

confidence: 94%

Structural Investigation of Hydrous TiO₂ Precipitates and Their Aging Products by X-ray Diffraction, Atomic Force Microscopy, and Transmission Electron Microscopy

Jalava

Heikkilä

Hovi

et al. 1998

Ind. Eng. Chem. Res.

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“…In contact mode, the tip apex is in firm contact with the surface throughout the scan, while maintaining a set load. 81 In this case, topographic and lateral force images are acquired simultaneously for both trace and retrace scan directions. Note, the lowest imaging force should be used to avoid the compression of the SLB.…”

Section: ■ Primary Methods For the Preparation Of Solid-supported Bil...mentioning

confidence: 99%

“…Two raster scan imaging modes are primarily used to characterize the structure and morphology of SLBs: tapping and contact mode. , Contact mode with soft cantilevers typically yields high-resolution images for gel phases, while tapping mode is necessary for liquid phases or layers with hydrophilic termini, which tend to have high adhesion to Si and Si 3 N 4 AFM tips. In contact mode, the tip apex is in firm contact with the surface throughout the scan, while maintaining a set load . In this case, topographic and lateral force images are acquired simultaneously for both trace and retrace scan directions.…”

Section: Characterization Of Solid-supported Bilayersmentioning

confidence: 99%

Preparation and Characterization of Solid-Supported Lipid Bilayers Formed by Langmuir–Blodgett Deposition: A Tutorial

et al. 2018

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The structure, phase behavior, and properties of cellular membranes are derived from their composition, which includes phospholipids, sphingolipids, sterols, and proteins with various levels of glycosylation. Because of the intricate nature of cellular membranes, a plethora of in vitro studies have been carried out with model membrane systems that capture particular properties such as fluidity, permeability, and protein binding but vastly simplify the membrane composition in order to focus in detail on a specialized property or function. Supported lipid bilayers (SLB) are widely used as archetypes for cellular membranes, and this instructional review primarily focuses on the preparation and characterization of SLB systems formed by Langmuir deposition methods. Typical characterization methods, which take advantage of the planar orientation of SLBs, are illustrated, and references that go into more depth are included. This invited instructional review is written so that nonexperts can quickly gain in-depth knowledge regarding the preparation and characterization of SLBs. In addition, this work goes beyond traditional instructional reviews to provide expert readers with new results that cover a wider range of SLB systems than those previously reported in the literature. The quality of an SLB is frequently not well described, and details such as topological defects can influence the results and conclusions of an individual study. This article quantifies and compares the quality of SLBs fabricated from a variety of gel and fluid compositions, in correlation with preparation techniques and parameters, to generate general rules of thumb to guide the construction of designed SLB systems.

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“…One reason for this could be the size of the tip apex used for STM, which is smaller than for AFM, although no details were given on the apex of the STM tip that they used. It has been observed that the pyramidal form of the AFM tip increases the size of the protuberance scanned, 26 thus causing an overestimation of the size of the grain. Moreover, depending on the spatial frequency of the protuberance on the surface, some small hills that have a diameter smaller than the diameter of the tip apex cannot be scanned 27 and consequently, they are not taken into account for the calculation of D. On the other hand, the coherence scattering length, ␦, obtained by XRD underestimates the size of the crystallographic grains, since grain boundaries, defects in the grain, and stresses in the films reduce the coherent scattering depth.…”

Section: Resultsmentioning

confidence: 99%

Growth Mode of Copper Films Electrodeposited on Silicon from Sulfate and Pyrophosphate Solutions

Cerisier¹,

Attenborough²,

Fransaer³

et al. 1999

J. Electrochem. Soc.

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The electrodeposition of thin copper films on silicon substrates from copper pyrophosphate and copper sulfate solutions, without the addition of additives or hydrofluoric acid, is presented. The copper films obtained from these two solutions have different characteristics. Cyclic voltammetry was performed in order to investigate the silicon/electrolyte interface. This provides an explanation why the copper pyrophosphate solution is more favorable for electrodepositing copper on a semiconductor substrate. The copper films obtained with the pyrophosphate solution, having thicknesses ranging from 20 to 280 nm, were characterized in detail. They are homogeneous, exhibit a metallic luster, and show good adhesion. The topography was examined by atomic force microscopy, providing the root‐mean‐square roughness and the average grain size on the surface. The grain size values are compared with the average value of the scattering coherence length determined by X‐ray diffraction. The kinetic roughening of the copper deposits was investigated by dynamic scaling behavior and compared to previous studies. © 1999 The Electrochemical Society. All rights reserved.

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Enhanced effects with scanning force microscopy

Cited by 7 publications

References 6 publications

Structural Investigation of Hydrous TiO₂ Precipitates and Their Aging Products by X-ray Diffraction, Atomic Force Microscopy, and Transmission Electron Microscopy

Structural Investigation of Hydrous TiO₂ Precipitates and Their Aging Products by X-ray Diffraction, Atomic Force Microscopy, and Transmission Electron Microscopy

Preparation and Characterization of Solid-Supported Lipid Bilayers Formed by Langmuir–Blodgett Deposition: A Tutorial

Growth Mode of Copper Films Electrodeposited on Silicon from Sulfate and Pyrophosphate Solutions

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Enhanced effects with scanning force microscopy

Cited by 7 publications

References 6 publications

Structural Investigation of Hydrous TiO2 Precipitates and Their Aging Products by X-ray Diffraction, Atomic Force Microscopy, and Transmission Electron Microscopy

Structural Investigation of Hydrous TiO2 Precipitates and Their Aging Products by X-ray Diffraction, Atomic Force Microscopy, and Transmission Electron Microscopy

Preparation and Characterization of Solid-Supported Lipid Bilayers Formed by Langmuir–Blodgett Deposition: A Tutorial

Growth Mode of Copper Films Electrodeposited on Silicon from Sulfate and Pyrophosphate Solutions

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Product

Resources

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Structural Investigation of Hydrous TiO₂ Precipitates and Their Aging Products by X-ray Diffraction, Atomic Force Microscopy, and Transmission Electron Microscopy

Structural Investigation of Hydrous TiO₂ Precipitates and Their Aging Products by X-ray Diffraction, Atomic Force Microscopy, and Transmission Electron Microscopy