Abstract:ZnO:Al(Al‐doped zinc oxide)/SrTiO3 composite thin film field emission (FE) devices are fabricated on heavily doped n‐type silicon substrates using a vacuum electron beam evaporation vapor deposition technique and hydrogen plasma treated technique. The morphology and thickness of SrTiO3 film and ZnO:Al film are controlled by adjusting and optimizing the growth conditions, deposition time, and post‐treatment conditions. FE experimental results show that the addition of ZnO:Al films can significantly improve the … Show more
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