2023
DOI: 10.1016/j.mseb.2023.116260
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Enhanced photoelectrochemical transient photoresponse properties of molybdenum oxide film deposited on black silicon

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Cited by 14 publications
(9 citation statements)
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“…The average τe is estimated to be 0.26 ms. This value is quite low and suggests a reasonable delay in the charge carrier recombination which support the observed significant photocurrent density [20,42].…”
Section: Impedance Spectroscopysupporting
confidence: 69%
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“…The average τe is estimated to be 0.26 ms. This value is quite low and suggests a reasonable delay in the charge carrier recombination which support the observed significant photocurrent density [20,42].…”
Section: Impedance Spectroscopysupporting
confidence: 69%
“…where β is the full width at half maximum (FWHM) of the diffraction line, θ is the diffraction angle, and λ = 0.15418 nm is the wavelength of the X-ray radiation The estimate crystallite size is reasonably small, whereas the calculated values of the dislocation density, microstrain and stacking fault is somewhat high when compared to our previous report on MoO3 film prepared by the chemical vapour deposition method [20]. This is due to the large value of the peak width observed for the pyrolyzed MoO3 film.…”
Section: Resultsmentioning
confidence: 52%
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