The c-axis oriented polycrystalline thin film of (Na,Bi)TiO 3 -BaTiO 3 (NBT-BT) around the morphotropic phase boundary (MPB) was prepared on an LaNiO 3 -buffered Si substrate by rf magnetron sputtering. The NBT-BT film showed a large crystal lattice distortion in the out-of-plane direction, and a voltage shift of the hysteresis loop along the negative field axis as large as %200 kV/cm, which indicates that the film is internally biased and strongly self-polarized towards the top electrode. Owing to the large internal bias field, the NBT-BT film exhibited a linear piezoelectric response with the piezoelectric coefficient, e à 31 , reaching %4.8 C/cm 2 in the unipolar excitation and a low dielectric permittivity of 230. The temperaturedependent dielectric properties revealed that the permittivity maximum temperature, T m , of the NBT-BT film was significantly enhanced to >550 °C from the >300 °C of bulk NBT-BT, accompanied by the disappearance of the depolarization temperature, T d , which is confirmed by the structural data where the crystal lattice remained unchanged up to >400 °C. These stable temperature properties would lead to an expansion of the temperature range of use of NBT-BT film.