Enhanced Reflectivity Change and Phase Shift of Polarized Light: Double Parameter Multilayer Sensor

Abstract

Herein, the concept of point of darkness based on polarized light phase difference and absorption of light is demonstrated by simulations using low refractive index and extinction coefficient semiconductor and dielectric, and high refractive index nonoxidizing metal multilayer thin film structures. Several multilayer sensor configurations show great sensitivity to thickness and refractive index variation of the detectable material by measuring the reflectivity ratio Ψ and phase shift Δ. Focus is on such multilayers, which have sensitivity to both parameters (Ψ, Δ) in the visible spectral range, thus opening the possibility for further research on a new biomedical sensor development with enhanced double parameter sensing.

Surface-Enhanced Raman Spectroscopy on an As-deposited Fano Resonance Multilayer Substrate

“…On the other hand, thin film multilayer systems can represent a very interesting alternative owing to their outstanding effects such as electromagnetic mode confinement, plasmonic effect, self-collimation, and sharp resonances that found application in several fields as sensing, − structural color, , anticounterfeiting, − and cooling , to name a few.…”