2020
DOI: 10.35848/1882-0786/aba7a5
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Enhanced X-ray reflectivity from Pt-coated silicon micropore optics prepared by plasma atomic layer deposition

Abstract: We report the enhancement of Pt-coated silicon micropore X-ray optics using plasma atomic layer deposition (ALD). High-aspect-ratio micropores of width 20 μm and depth 300 μm were coated with ∼20 nm Pt and ∼10 nm Al 2 O 3 . The estimated surface roughnesses, determined from X-ray reflectivity curves for Al Kα 1.49 keV radiation, were -+ 1.2 1.0 0.6 and 1.6 ± 0.1 nm rms before and after the plasma ALD, respectively. The plasma ALDcoated Pt film shows no significant change compared to the underlying silicon and … Show more

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Cited by 8 publications
(1 citation statement)
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“…The required grasp of 10 cm2 deg2 at 0.6 keV is marginally satisfied with the Pt coated telescope, while it can be satisfied with large margin in the case of Co coating. Therefore, while smooth Pt atomic layer deposition coating has been established in the GEO-X team, 33 Co possibility is being pursued 34…”
Section: Geo-x Missionmentioning
confidence: 99%
“…The required grasp of 10 cm2 deg2 at 0.6 keV is marginally satisfied with the Pt coated telescope, while it can be satisfied with large margin in the case of Co coating. Therefore, while smooth Pt atomic layer deposition coating has been established in the GEO-X team, 33 Co possibility is being pursued 34…”
Section: Geo-x Missionmentioning
confidence: 99%