2019
DOI: 10.1016/j.mssp.2019.02.026
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Enhancement in optoelectrical properties of polycrystalline ZnO thin films by Ar plasma

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Cited by 10 publications
(6 citation statements)
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“…The peak observed at approximately 380 nm was due to the near-band-edge (NBE) emission of the ZnO thin films, which was attributed to the recombination of the free excitons. 30 However, the origin of the peaks observed at approximately 420 nm and 425 nm was unclear. To determine the origin of these peaks, we fitted the PL spectra of the ZnO thin films by using Gaussian functions, as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The peak observed at approximately 380 nm was due to the near-band-edge (NBE) emission of the ZnO thin films, which was attributed to the recombination of the free excitons. 30 However, the origin of the peaks observed at approximately 420 nm and 425 nm was unclear. To determine the origin of these peaks, we fitted the PL spectra of the ZnO thin films by using Gaussian functions, as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Theoretically, the narrower the band gap, the easier it is to generate carriers, which has a higher photocatalytic degradation efficiency. The possible reason is that hydrogen acts as a shallow donor in ZnO, leading to a reduced band gap [30].…”
Section: Photocatalytic Degradation Kineticsmentioning
confidence: 99%
“…Photocatalytic performance of ZnO depends on the modification conditions and methods [29]. Dao et al [30] modified ZnO thin films by Ar plasma, and etching was observed on the surface. The grains on the surface were etched out, leading to a flatter surface with a smaller roughness.…”
Section: Introductionmentioning
confidence: 99%
“…Some studies attributed the enhancement and broadening of PL to the increase of bound excitons due to the introduction of H-related recombination centers . Meanwhile, Ar plasma treatment, which does not introduce H-related impurity, also achieves the enhancement and broadening up to 160 meV . Li et al claimed the broadening observed in PL is related to roughness on the surface .…”
Section: Introductionmentioning
confidence: 99%