2005
DOI: 10.1016/j.nimb.2005.05.015
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Enhancement of c-axis texture of AlN films by substrate implantation

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Cited by 3 publications
(1 citation statement)
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“…Figure 6 shows the crystallite size as a function of the treatment time of unexposed and nitrided samples of the Al (2 0 0) reflection plane at 1 and 2 mbar pressures, respectively. At both pressures, the crystallite size increases with the increase in the nitriding time [24]. The increase in crystallite size with the processing time is due to the increase in adatom mobility, high strain energy or higher crystallinity of AlN thin layers [25].…”
Section: Crystallite Size Measurementsmentioning
confidence: 99%
“…Figure 6 shows the crystallite size as a function of the treatment time of unexposed and nitrided samples of the Al (2 0 0) reflection plane at 1 and 2 mbar pressures, respectively. At both pressures, the crystallite size increases with the increase in the nitriding time [24]. The increase in crystallite size with the processing time is due to the increase in adatom mobility, high strain energy or higher crystallinity of AlN thin layers [25].…”
Section: Crystallite Size Measurementsmentioning
confidence: 99%