“…17 Low-resolution TEM images (Figure 1b and 1c) of an air-exposed CrCl 3 flake confirm the lamellar structure of CrCl 3 , with a few- layer (estimated to be composed of 5-8 layers) contour region of lateral dimension of 100-200 nm, while the inner region can be identified as "bulk-like" CrCl 3 flake with a thickness in a range of 5-10 nm. 16 As revealed by EDX maps of O K α , Cl K α , and Cr K α (Figure 1d,e, and f), apart from a ubiquitous presence of carbon (C K α map is not reported), the outer few-layer contour of the flake is characterized by the presence of Cr and O, while Cl is residual. This is confirmed by Figure 1g, where the EDX signals are measured along the yellow line scan in the TEM image crossing the bulk/contour (few-layer/substrate grid) region.…”