Broadband
antireflection is crucial to improving the performance
of various optical, photofunctional, and optoelectronic devices. The
present study demonstrates an unconventional etching process employing
pillar-shaped SiO2 masks that allows the synthesis of black
silicon exhibiting ultralow reflectivity. In this process, the morphologies
of mushroomlike SiO2 nanopillar arrays fabricated from
self-assembled block copolymers and having a high aspect ratio are
drastically changed during etching. This effect results in multistage
etching of an underlying silicon substrate to produce a silicon nanocone
array with an average height of 800 nm and multiple nanoscale tips.
This silicon nanostructure exhibits a low reflectance of less than
0.06% when exposed to light at a normal angle of incidence over a
wide range of wavelengths from 300 to 900 nm. In addition, the reflectance
remains as low as 1.6% or less for incident angles of 0 to 60°,
and this omnidirectional antireflection behavior appears in both s-
and p-polarized light. A silicon nanocone array fabricated in this
manner effectively absorbs UV laser light and was applied as an inorganic
substrate for matrix-free laser desorption/ionization mass spectrometry.
The morphology of this material facilitated the desorption of various
analyte molecules, including drugs, peptides, and proteins with masses
up to approximately 17 kDa. This work demonstrates an alternative
approach to obtaining black silicon that has considerable potential
for applications in various fields, such as optics, optoelectronics,
and chemical analysis.