Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing

Abstract

Abstract-A novel approach to dynamic SEE ADC testing ispresented. The benefits of this test scheme versus prior implemented techniq ues include the ab ility to observe ADC SEE errors that are in the form of phase shifts, single bit upsets, bursts of disrupted signal composition, and device clock loss.

Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

“…As a summary, the SEU/SET response of the ADS5483 4. SEU/SET rate did not increase significantly with frequency (10 MHz vs. 100 MHz) [13], [14].…”