Unconventional Resources Technology Conference, Denver, Colorado, 12-14 August 2013 2013
DOI: 10.1190/urtec2013-240
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Enhancing SEM Grayscale Images through Pseudocolor Conversion: Examples from Eagle Ford, Haynesville, and Marcellus Shales

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Cited by 4 publications
(7 citation statements)
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“…Segmentation of AFM elastic moduli maps into organic and inorganic components was carried out through comparison to backscattered electron scanning electron microscopy (BSE), and EDX images of the same sample regions. The methodology of Camp and Wawak (2013) was applied to BSE images to produce pseudo-greyscale images for thresholding. Four greyscale classes were identified, and comparison with EDX element maps showed that these can be interpreted as organic carbon, carbonate, aluminosilicate + quartz, and 'heavy' phases (pyrite, apatite, etc.).…”
Section: Mechanical Segmentation and Data Analysismentioning
confidence: 99%
“…Segmentation of AFM elastic moduli maps into organic and inorganic components was carried out through comparison to backscattered electron scanning electron microscopy (BSE), and EDX images of the same sample regions. The methodology of Camp and Wawak (2013) was applied to BSE images to produce pseudo-greyscale images for thresholding. Four greyscale classes were identified, and comparison with EDX element maps showed that these can be interpreted as organic carbon, carbonate, aluminosilicate + quartz, and 'heavy' phases (pyrite, apatite, etc.).…”
Section: Mechanical Segmentation and Data Analysismentioning
confidence: 99%
“…The residual data are then checked for a maximum value of organic matter Young's modulus, achieved by comparing the AFM QI™ scans with their equivalent SEM scan and EDX data obtained. This was undertaken first by enhancing the SEM through color thresholding using the method proposed by Camp (2013). The pixel values of the enhanced SEM are then manually compared with visible values for organic matter and porosity.…”
Section: Methodsmentioning
confidence: 99%
“…The resulting signals, which are secondary electrons (SE), backscattered electrons (BSE), or X-rays can be used to image the sample (Curtis et al, 2010). Both backscattered electron and secondary electron images are produced by assigning grayscale values to represent signal intensity measurements (Camp et al, 2013). Secondary electrons (SE) are low voltage electrons arising from the inelastic interactions between the primary electron beam and the sample (Nanakoudis, 2019).…”
Section: Motivation and Problem Statementmentioning
confidence: 99%
“…Secondary electrons (SE) are low voltage electrons arising from the inelastic interactions between the primary electron beam and the sample (Nanakoudis, 2019). Secondary electron images are useful to study the topography of the sample surface, including rock fabric, texture, and mineral, pore, and microfossil morphology (Camp et al, 2013, Nanakoudis, 2019. These images also make it possible to evaluate near-surface negative aberrations such as pores and cracks from polished or ion-milled surfaces (Camp et al, 2013).…”
Section: Motivation and Problem Statementmentioning
confidence: 99%
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