2005
DOI: 10.1021/ac050616c
|View full text |Cite
|
Sign up to set email alerts
|

Enhancing the Signal-to-Noise Ratio of X-ray Diffraction Profiles by Smoothed Principal Component Analysis

Abstract: X-ray diffraction is one of the most widely applied methodologies for the in situ analysis of kinetic processes involving crystalline solids. However, due to its relatively high detection limit, it has only limited application in the context of crystallizations from liquids. Methods that can improve the detection limit of X-ray diffraction are therefore highly desirable. Signal processing approaches such as Savitzky-Golay, maximum likelihood, stochastic resonance, and wavelet transforms have been used previous… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
19
0

Year Published

2006
2006
2024
2024

Publication Types

Select...
6
1

Relationship

1
6

Authors

Journals

citations
Cited by 26 publications
(19 citation statements)
references
References 19 publications
0
19
0
Order By: Relevance
“…PCA, described in17–21, defines latent variables or PC that are defined to capture the maximum variance in a dataset and are comprised of a combination of properties to capture this variance. PCA is used in this work to quantitatively analyze the DOS to classify materials based on crystal structure.…”
Section: Discussionmentioning
confidence: 99%
“…PCA, described in17–21, defines latent variables or PC that are defined to capture the maximum variance in a dataset and are comprised of a combination of properties to capture this variance. PCA is used in this work to quantitatively analyze the DOS to classify materials based on crystal structure.…”
Section: Discussionmentioning
confidence: 99%
“…3. Treatment of the recorded XRD profiles consisted of data smoothing using a Smooth Process Component Analysis (SPCA) algorithm [21] to smooth the profiles by reducing the noise component of the signals, followed by background subtraction to remove the diffraction component due to solvent scattering, peak searching and peak fitting using Bede [28] Polycrystal V1.00 software to determine peak areas.…”
Section: Process Xrdmentioning
confidence: 99%
“…Previous independent studies monitoring L-glutamic acid (LGA) using on-line video microscopy [17][18][19][20] and on-line XRD [11,[21][22][23] have shown the potential of using these techniques to detect and monitor polymorphs during the early stages of crystallisation. For the first time, the two on-line techniques have been coupled to simultaneously observe the solution mediated phase transformation of LGA [24][25][26][27].…”
Section: Introductionmentioning
confidence: 99%
“…Other methods use wavelets or Fourier transforms, which are both reviewed by Artursson et al (2000). Chen et al (2005) used smooth principal components to exploit the shared variation in a set of different patterns. This can be valuable in some cases but also limits the applicability of the method, because often only a single scan is obtained.…”
Section: Smoothingmentioning
confidence: 99%