Epicarp characterization of coffee fruits by atomic force microscopy

Cardona, Yenny; Oliveros, Carlos; Arias, D.; Álvarez, Fernando; Devia, A.

doi:10.1016/j.jfoodeng.2007.09.031

Cited by 3 publications

(3 citation statements)

References 13 publications

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“…For apples, the superficial characteristics were investigated and their three-dimensional structure was determined with confocal laser scanning microscopy (CLSM), conventional light microscopy (LM), and environmental scanning electron microscopy (ESEM) (Veraverbeke et al, 2003). Studies in coffee (Cardona et al, 2008) and peach (Yang et al, 2005) have been reported using the atomic force microscopy (AFM) to characterize the roughness of the fruit epicarp and the cells that compose it in different states of development. The different qualities of fruits were studied by obtaining microstructural properties with scanning electron microscopy (SEM) and relating them to texture profiles (Allan-Wojtas et al, 2003;Lanza and Di Serio, 2011;Lanza, 2012;Martens and Thybo, 2000).…”

Section: Introductionmentioning

confidence: 99%

SEM characterization of olive (Olea europaea L.) fruit epicuticular waxes and epicarp

Lanza

Serio

2015

Scientia Horticulturae

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Section: Introductionmentioning

confidence: 99%

SEM characterization of olive (Olea europaea L.) fruit epicuticular waxes and epicarp

Lanza

Serio

2015

Scientia Horticulturae

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“…According to Hershko and Nussinovitch (1998), the R a of uncoated onion skin was reported 6.0 ± 3.6 μm by literature and about 78 nm by AFM. Yang et al (2005), Cardona, Oliveros, Arias, Alvarez, and Devia (2008), Czieczor et al (2018), and Ringer et al (2018) reported that the roughness measured by AFM was lower than that measured by other methods for agricultural products. Based on literature review by the authors, the surface profilometer, laser profilometer, and AFM showed the roughness of certain plastics at 0.24 ± 0.11 μm, 0.81 ± 0.06 μm, and 0.73 ± 0.22 nm, respectively.…”

Section: Resultsmentioning

confidence: 99%

Classification of bananas during ripening using peel roughness analysis—An application of atomic force microscopy to food process

Khodabakhshian

Baghbani

2021

J Food Process Engineering

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To monitor banana surface (peel) roughness changes during ripening treatment, atomic force microscopy (AFM) as a novel and emerging technique was used in this study. The roughness of banana peel was studied using the arithmetic mean between peaks and troughs (Ra) and the root‐mean‐square roughness (Rq). It was concluded that with changing the ripening stages, the behavior of the roughness changes significantly. With advancing fruit ripening, the extending of the epicarp and the decrease of the surface (peel) roughness were found due to enlarging of fruit volume. The highest mean roughness was found to be at stage 1, Ra = 8.25 and Rq = 9.65 nm. Based on two‐dimensional profile results, the surface (peel) roughness was affected strongly by studied different ripening stages. It was concluded that the peak values in the ripple profiles become smaller with advancing fruit ripening. However, the effects of noise in the profiles appeared to increase. So, in all the initial stages of banana fruit ripening, the noise was found to be minimal. Consequently, the AFM technique was found to be a promising tool for quantification of the peel roughness or glossiness and also could help in the quality control of banana fruit on the nanoscale.

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“…Cardona et al 43 made a superficial characterisation of the epicarp of coffee fruits. The objective of their study was to characterise the epicarp by analysing the changes in roughness that occur between green and mature coffee fruits and to determine the dimensions and density of cells of the epicarp by the AFM technique.…”

Section: Surface Topographymentioning

confidence: 99%

Advances in research on structural characterisation of agricultural products using atomic force microscopy

Liu

Fang

2011

J. Sci. Food Agric.

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Atomic force microscopy (AFM) has many unique features compared with other conventional microscopies, such as high magnification with high resolution, minimal sample preparation, acquiring 2D and 3D images at the same time, observing ongoing processes directly, the possibility of manipulating macromolecules, etc. As a nanotechnology tool, AFM has been used to investigate the nanostructure of materials in many fields. This mini-review focuses mainly on its latest application to characterise the macromolecular nanostructure and surface topography of agricultural products. First the fundamentals of AFM are briefly explained. Then the macromolecular nanostructure information on agricultural products from AFM images is introduced by exploring the structure-function relationship in three aspects: agricultural product processing, agricultural product ripening and storage, and genetic and environmental factors. The surface topography characterisation of agricultural products using AFM is also discussed. The results reveal that AFM could be a powerful nanotechnology tool to acquire a deeper understanding of the mechanisms of structure and quality variations of agricultural products, which could be instructive in improving processing and storage technologies, and AFM is also helpful to reveal the essential nature of a product at nanoscale.

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Epicarp characterization of coffee fruits by atomic force microscopy

Cited by 3 publications

References 13 publications

SEM characterization of olive (Olea europaea L.) fruit epicuticular waxes and epicarp

SEM characterization of olive (Olea europaea L.) fruit epicuticular waxes and epicarp

Classification of bananas during ripening using peel roughness analysis—An application of atomic force microscopy to food process

Advances in research on structural characterisation of agricultural products using atomic force microscopy

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