2009
DOI: 10.1016/j.jcrysgro.2008.11.085
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Epitaxial Ba0.5Sr0.5TiO3–GaN heterostructures with abrupt interfaces

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Cited by 17 publications
(7 citation statements)
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“…Deposition in water vapour reduces the FWHM values in φ by a factor of two compared with deposition in oxygen, from 3.7° to 1.6°. Though substantial, these line widths are consistent with the 7% lattice mismatch at this oxide-nitride interface and compare favourably to reports of cubic oxide epitaxy on GaN, particularly with respect to in-plane crystallinity 6,12,25,26 . We note that a low-resolution x-ray diffraction configuration was used (crossed beam collimator and receiving slits) to maximize intensity as the films are 25 nm thick.…”
Section: Film Characterizationsupporting
confidence: 88%
See 1 more Smart Citation
“…Deposition in water vapour reduces the FWHM values in φ by a factor of two compared with deposition in oxygen, from 3.7° to 1.6°. Though substantial, these line widths are consistent with the 7% lattice mismatch at this oxide-nitride interface and compare favourably to reports of cubic oxide epitaxy on GaN, particularly with respect to in-plane crystallinity 6,12,25,26 . We note that a low-resolution x-ray diffraction configuration was used (crossed beam collimator and receiving slits) to maximize intensity as the films are 25 nm thick.…”
Section: Film Characterizationsupporting
confidence: 88%
“…With conventional growth techniques, at only several monolayers thickness, rocksalt films collapse into pyramidal islands with {100} faces [9][10][11] . This seemingly unavoidable behaviour leads to a grainy morphology and diminished functionality 12,13 . The surfactant-assisted method applied currently to CaO can be extended to more complicated systems.…”
mentioning
confidence: 99%
“…In addition to a thorough investigation of the structure, this work further addresses important practical aspects of ferroelectric behavior, including material fatigue (exhibiting 10.2% degradation after 1.1 × 10 10 cycles), and leakage (<2 μA cm −2 ). Alternative integration approaches were attempted by PLD and RF magnetron sputtering of ferroelectric Ba 0.5 Sr 0.5 TiO 3 directly on GaN without buffer layers, which resulted in films that exhibited domain structures.…”
Section: Materials and Functional Propertiesmentioning
confidence: 99%
“…Devices such as heterojunction bipolar transistors, quantum well lasers and heterojunction field effect transistors (FET), already have a significant technological impact. The semiconductor-ferroelectric heterostructures have attracted much attention due to their large potential for electronic and optoelectronic device applications (Lorentz et al, 2007;Losego et al, 2009;Mbenkum et al, 2005;Voora et al, 2009;. The ferroelectric constituent possesses switchable dielectric polarization, which can be exploited for modificating the electronic and optical properties of a semiconductor heterostructure.…”
mentioning
confidence: 99%
“…Thus, it is interesting to grow high quality wurtzite ZnO and InN films on perovskite STO substrates, and it is useful to determine the valence band offset (VBO) of these heterojunctions. The heterojunction of semiconductor-ZnO or InN/ferroelectric-BaTiO 3 (BTO) provides an interesting optoelectronic application due to the anticipated strong polarization coupling between the fixed semiconductor dipole and the switchable ferroelectric dipole (Lorentz et al, 2007;Losego et al, 2009;Mbenkum et al, 2005;Voora et al, 2009;. ZnO TFT, highly attractive for display applications due to transparency in the visible and low growth temperatures, are limited by large threshold and operating voltages (Kim et al, 2005).…”
mentioning
confidence: 99%