2006
DOI: 10.1063/1.2161849
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Epitaxial Bi∕GaAs(111) diodes via electrodeposition

Abstract: Bismuth films formed by electrodeposition on n-GaAs (111) at 70°C are found to be single crystalline, (0001) oriented, with trigonal surface morphologies typical of high quality single crystals. Diode current-voltage characteristics display low reverse-bias leakage currents and average barrier heights of 0.77±0.02eV (n=1.07). A necessary requirement for single crystalline growth is the presence of ammonium sulfate in the electrolyte.

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Cited by 19 publications
(12 citation statements)
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“…Interestingly, grains rotated by 90°were not observed indicating that the Bi nucleation was sensitive to surface misorientation or step chemistries. 13 Faint triangular features are also found on the Bi film surfaces grown on GaAs ͑100͒ substrates while the Bi/ GaAs ͑110͒ substrate surfaces were relatively featureless. 19 Scanning electron microscopy ͑SEM͒ images of the Bi films deposited on GaAs ͑111͒, ͑100͒, and ͑110͒ substrates are shown in Fig.…”
Section: Resultsmentioning
confidence: 98%
See 1 more Smart Citation
“…Interestingly, grains rotated by 90°were not observed indicating that the Bi nucleation was sensitive to surface misorientation or step chemistries. 13 Faint triangular features are also found on the Bi film surfaces grown on GaAs ͑100͒ substrates while the Bi/ GaAs ͑110͒ substrate surfaces were relatively featureless. 19 Scanning electron microscopy ͑SEM͒ images of the Bi films deposited on GaAs ͑111͒, ͑100͒, and ͑110͒ substrates are shown in Fig.…”
Section: Resultsmentioning
confidence: 98%
“…In the case of Si contacts, there are a number of low mismatch, silicide/Si ͑111͒ interfaces. 13 The presence of the ammonia sulfate likely inhibits the oxidation of the metal ions as well as the GaAs surface. These have been experimentally 1,2 and theoretically 3 correlated with Schottky barrier heights that differ by 0.14 eV.…”
Section: Introductionmentioning
confidence: 99%
“…A number of approaches have been used to deposit metal islands on semiconductor substrates. Typical examples include physical evaporation against templates, , which requires expensive high vacuum evaporation systems, and electrochemical /electroless plating, , which usually produces metal nanoparticles coated with organic surfactant molecules. If appropriate metal precursors and semiconductor wafers are carefully chosen, simple galvanic reactions between metal precursors and semiconductors can induce direct deposition of metal nanoparticles with clean surfaces on the semiconductor wafers. Similar galvanic reactions between metal precursors and metal substrates have also been employed to deposit metal nanoparticles on metal surfaces and synthesize hollow nanostructures. We recently studied the reaction between a neutral aqueous solution of AgNO 3 and single-crystalline n-type GaAs wafers with dopant (Si) concentrations higher than 1 × 10 18 cm −3 : 12AgNO 3 + 2GaAs + 6H 2 O 12Ag + Ga 2 O 3 + As 2 O 3 + 12HNO 3 This room temperature reaction generates high-quality Ag nanoplates on the GaAs substrates. The morphologies of the Ag structures are significantly different from those of products (i.e., Ag particles with irregular shapes) grown with acidic solutions of metal precursors .…”
Section: Introductionmentioning
confidence: 99%
“…4 A number of approaches have been used to deposit metal islands on semiconductor substrates. Typical examples include physical evaporation against templates, 4,14 which requires expensive high vacuum evaporation systems, and electrochemical [21][22][23][24] /electroless plating, 2,[25][26][27] which usually produces metal nanoparticles coated with organic surfactant molecules. If appropriate metal precursors and semiconductor wafers are carefully chosen, simple galvanic reactions between metal precursors and semiconductors can induce direct deposition of metal nanoparticles with clean surfaces on the semiconductor wafers.…”
Section: Introductionmentioning
confidence: 99%
“…The latter is guaranteed through the use of middle and low-doped semiconducting substrates (N D < 1 ·10 ), which provides wide Bi/semiconductor Schottky barriers. Although Bi/n-GaAs diodes have already been obtained via electrodeposition (14) (15) (16), there are no quantum transport studies of Bi ultrathin films in this configuration. This lack of measurements could be related to a bad electrical isolation due to the high porosity of Bi ultra-thin films grown on n-GaAs electrodes.…”
Section: Introductionmentioning
confidence: 99%