Epitaxial Bi/ GaAs diodes have been formed by electrodeposition from bismuth nitrate and ammonium sulfate ͑͑NH 4 ͒ 2 SO 4 ͒ aqueous solutions. Bi grows ͑0001͒ oriented on both GaAs ͑111͒B and ͑001͒ substrates while it tilts 16°to a ͑011 គ 8͒ surface orientation for ͑011͒ GaAs. The metal orients in all cases with its ͕112 គ 0͖ planes parallel the GaAs ͕110͖ planes. Diodes prepared on ͑001͒, ͑111͒B, and ͑011͒ wafers have current-voltage barrier heights ⌽ B IV that vary from 0.74, to 0.76, to 0.83 eV ͑n = 1.01-1.11͒, respectively. These barrier heights straggle values from earlier reports for polycrystalline Bi deposited by ultrahigh vacuum techniques or electrodeposition. Barrier heights measured from high frequency, capacitance-voltage characteristics are higher than the ⌽ B IV results, 0.06-1.5 eV, as a function of the GaAs orientation, increasing in value in order of ͑011͒, ͑001͒, to ͑111͒B. This is explained by a combination of image force lowering and field emission corrections, and interface state/dipoles that are likely dependent on the GaAs orientation and on the degree of ͑0001͒ Bi alignment. These results are supported by cross-sectional transmission electron microscopy investigations indicating abrupt Bi/ GaAs interfaces without evidence of a significant interfacial oxide or reacted layer.