2011
DOI: 10.1016/j.physc.2011.04.010
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Epitaxial growth of Ce2Y2O7 buffer layers for YBa2Cu3O7−δ coated conductors using reel-to-reel DC reactive sputtering

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Cited by 12 publications
(5 citation statements)
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“…Figure 1 shows the surface morphologies of CeO 2 films on Ni-W tape substrate with various thicknesses of 80, 150, and 200 nm. It is revealed that the morphology of the CeO 2 films is strongly subject to the thickness, in agreement with the observation [22]. Crack-free, pinhole-free and compact CeO 2 buffer layers can be achieved as seen in figure 1 in cases of various thicknesses.…”
Section: Resultssupporting
confidence: 88%
See 1 more Smart Citation
“…Figure 1 shows the surface morphologies of CeO 2 films on Ni-W tape substrate with various thicknesses of 80, 150, and 200 nm. It is revealed that the morphology of the CeO 2 films is strongly subject to the thickness, in agreement with the observation [22]. Crack-free, pinhole-free and compact CeO 2 buffer layers can be achieved as seen in figure 1 in cases of various thicknesses.…”
Section: Resultssupporting
confidence: 88%
“…Due to the expensive equipment and complex processes needed, extensive efforts have been made by different groups either to simplify the buffer architecture or to explore costeffective techniques such as chemical solution deposition. In our group, several oxides with a pyrochlore or perovskite structure such as La 2 Zr 2 O 7 , Ce 2 Y 2 O 7 or Gd 2 Zr 2 O 7 were investigated with respect to a single buffer layer [21,22]. However, we note that CeO 2 thin film may act as a single buffer as well, provided that the problem of its thickness induced cracks is overcome.…”
Section: Introductionmentioning
confidence: 99%
“…high biaxial texture, low surface roughness, as well as good barrier behavior) that should be balanced, it appears that fully meeting the requirements of buffer layers remains challenging. To date, many efforts focusing on enhancing the understanding of fundamental issues of the developed buffer layer materials produced by chemical solution methods [10,11], as well as exploration of potential buffer layer materials or novel buffer layer configurations with superior performance, are still ongoing [12].…”
Section: Introductionmentioning
confidence: 99%
“…The in-plane FWHMs for YBCO films on LZO and CYO/LZO buffered NiW tapes are 8.0°and 6.2°, respectively, revealing a remarkable improvement for YBCO in texture due to additional buffer CYO layer involved. This is attributed to the CYO with better biaxially texture, and thus being easier for YBCO epitaxial growth than on the LZO [16]. Figure 8 shows the transport T c measurements for both architecture YBCO/LZO/NiW and YBCO/CYO/LZO/NiW.…”
Section: Resultsmentioning
confidence: 99%
“…A Ce-Y alloy with an atomic number ratio of 1: 1 is used as sputtering target. More details on the CYO deposition can be found elsewhere [16].…”
Section: Methodsmentioning
confidence: 99%