The epitaxial growth and the formation of an interface layer for MnSb sputtered films fabricated on Si (111) single crystal substrates was investigated. It was found that (1) at Tsub=200 °C, MnSb grains grew epitaxially with (101) orientation as the dominant crystal orientation on a Si (111) substrate and (2) at Tsub=250 °C (a) in the thickness region from 0 to 70 nm, a MnSi reacted layer was formed and grown epitaxially with (111) orientation, (b) in the thickness region over 70 nm, MnSb grains were formed and grown epitaxially with c-plane orientation on the MnSi interface layer.