ZnSe layers grown by molecular beam epitaxy (MBE), after processing by epitaxial lift-off, have been analyzed using fracture mechanics and thin-film interference to determine their adhesion properties on two different substrates, viz. ZnSe and glass, yielding adhesion energy of 270 ± 60 mJ m À2 and 34 ± 4 mJ m À2 , respectively. These values are considerably larger than if only van der Waals forces were present and imply that adhesion arises from chemical bonding.