2018
DOI: 10.1016/j.jallcom.2018.05.209
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Epitaxial mosaic-like Mn5Ge3 thin films on Ge(001) substrates

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Cited by 8 publications
(6 citation statements)
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“…The fact that the patterns are constituted of several peaks is a consequence of having textured films, where single grains have a complex but well-defined epitaxial relationship as evidenced in a previous work by transmission electron microscopy (reference [18]). In figure 1(c The interface quality of the films grown by RDE and SPE, examined by high-resolution transmission electron microscopy [18] do not exhibit any observable differences. In both cases the interface is extended a few atomic layers, corresponding approximately to the thickness of Schottky barriers, i.e.…”
Section: Resultsmentioning
confidence: 73%
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“…The fact that the patterns are constituted of several peaks is a consequence of having textured films, where single grains have a complex but well-defined epitaxial relationship as evidenced in a previous work by transmission electron microscopy (reference [18]). In figure 1(c The interface quality of the films grown by RDE and SPE, examined by high-resolution transmission electron microscopy [18] do not exhibit any observable differences. In both cases the interface is extended a few atomic layers, corresponding approximately to the thickness of Schottky barriers, i.e.…”
Section: Resultsmentioning
confidence: 73%
“…001). (c) Reprinted from [18]. Copyright (2018), with permission from Elsevier, employing VESTA software (reference [22]).…”
Section: Introductionmentioning
confidence: 99%
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“…In the search for a Ge-based material exhibiting an effective Schottky barrier with a Si-compatible semiconductor, the Mn 5 Ge 3 compound has been proposed as a promising candidate due to its high resistivity, its direct integration on a Si or Ge substrate [1][2][3] , its easy growth implementation via solid phase epitaxy (SPE) 4,5 , sputtering 6 or low-temperature codeposition 7 , and its atomically abrupt interface with Ge. Its implementation in metaloxide-semiconductor capacitors 8 and in Schottky diodes on n-type Ge 8-10 has paved the way toward its use in device structures.…”
Section: Introductionmentioning
confidence: 99%
“…It has been found that T C increases with carbon doping up to 445 K [1]. Mn 5 Ge 3 has a hexagonal crystal structure P6 3 /mcm and lattice constants a = 7.184 Å and c = 5.053 Å, allowing epitaxial growth on Ge(111) substrates within a lattice mismatch of 3.7% [2]. On the other hand, Mn 5 Ge 3 /Ge (001) heterostructures are compatible with the Si(001) technology [3].…”
mentioning
confidence: 99%