2004
DOI: 10.1116/1.1740769
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Errata: “Chiral pattern formation: Combined transmission electron microscopy and atomic force microscopy study of tetracyano- quinodimethane thin film grown by vacuum evaporation” [J. Vac. Sci. Technol. B 20, 673 (2002)]

Abstract: Articles you may be interested inMicrostructural properties and dislocation evolution on a GaN grown on patterned sapphire substrate: A transmission electron microscopy study

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Cited by 5 publications
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“…Examples for a common MEMS device are digital mirror devices used in digital projection displays (DMDs). Liu and Bhushan [659][660][661][662] used an AFM to test the frictional and mechanical properties of the hinge of the DMD and the force necessary to tilt the mirrors. The adhesive force on the landing sites were measured for different materials.…”
Section: Adhesion In Mems and Proteinsmentioning
confidence: 99%
“…Examples for a common MEMS device are digital mirror devices used in digital projection displays (DMDs). Liu and Bhushan [659][660][661][662] used an AFM to test the frictional and mechanical properties of the hinge of the DMD and the force necessary to tilt the mirrors. The adhesive force on the landing sites were measured for different materials.…”
Section: Adhesion In Mems and Proteinsmentioning
confidence: 99%
“…[1,2] For example, adhesion is the major cause of the failure of accelerometers used in automobile air bag triggering mechanisms [3] and in micromirror components of commercial digital light processing (DLP) equipment. [2,[4][5][6][7] Wear has been found to compromise the performance of NEMS-based atomic force microscopy (AFM) data storage systems. [8][9] In order to improve tribological performance, lubricants are applied to the MEMS/NEMS device surfaces.…”
mentioning
confidence: 99%
“…20 It should be pointed out that the high-voltage electron beam in the TEM system could cause the film to convert from crystalline to amorphous in less than 20 s as that observed in other crystalline organic films. 21 STM observations are performed on the samples deposited on HOPG substrate in order to get further insight into the film growth mechanism and crystal structure. Figure 5 shows the typical images.…”
Section: Resultsmentioning
confidence: 99%