Erratum: Broadband-infrared assessment of phonon resonance in scattering-type near-field microscopy [Phys. Rev. B<b>83</b>, 045404 (2011)]

Amarie, Sergiu; Keilmann, F.

doi:10.1103/physrevb.84.199904

Cited by 17 publications

(29 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…1120 cm -1 is assigned to the SiO 2 surface phonon is seen in the IR spectrum. 16,26,30,29,40 For the G/SiO 2 spectrum shown in Figure 2(a) (red, dotted line), the SiO 2 band is visible and we see a clear increase of the peak height on the graphene for the G/SiO 2 heterostucture. Such behavior has been reported before and it is ascribed to the interaction of the graphene Dirac plasmons with the low frequency lattice vibration of the underlying SiO 2 substrate.…”

Section: Resultsmentioning

confidence: 83%

Graphene/h-BN plasmon–phonon coupling and plasmon delocalization observed by infrared nano-spectroscopy

et al. 2015

View full text Add to dashboard Cite

We observed the coupling of graphene Dirac plasmons with different surfaces using scattering-type scanning near-field optical microscopy integrated into a mid-infrared synchrotron-based beamline. A systematic investigation of a graphene/hexagonal boron nitride (h-BN) heterostructure is carried out and compared with the well-known graphene/SiO2 heterostructure. Broadband infrared scanning near-field optical microscopy imaging is able to distinguish between the graphene/h-BN and the graphene/SiO2 heterostructure as well as differentiate between graphene stacks with different numbers of layers. Based on synchrotron infrared nanospectroscopy experiments, we observe a coupling of surface plasmons of graphene and phonon polaritons of h-BN (SPPP). An enhancement of the optical band at 817 cm(-1) is observed at graphene/h-BN heterostructures as a result of hybridization between graphene plasmons and longitudinal optical phonons of h-BN. Furthermore, longitudinal optical h-BN modes are preserved on suspended graphene regions (bubbles) where the graphene sheet is tens of nanometers away from the surface while the amplitude of transverse optical h-BN modes decrease.

show abstract

Section: Resultsmentioning

confidence: 83%

Graphene/h-BN plasmon–phonon coupling and plasmon delocalization observed by infrared nano-spectroscopy

et al. 2015

View full text Add to dashboard Cite

show abstract

“…Systematic improvements in the light sources and detection methods available for near-field spectroscopy now enable sufficiently high signal-to-noise levels and fast acquisition times for routine, reproducible measurements 7,8 . Fig.…”

Section: Nano-resolved Extraction Of Optical Constantsmentioning

confidence: 99%

“…Among such techniques, apertureless near-field scanning optical microscopy (ANSOM) 2,3 has shattered the diffraction limit, achieving optical resolutions better than λ/1000 at infrared and THz frequencies [4][5][6] . Recent coupling of ANSOM to a broadband coherent infrared light source and asymmetric Michelson interferometer has enabled Fourier transform infrared spectroscopy at the nanometer length scales (nanoFTIR) [7][8][9] , in switchable combination with single-frequency imaging by the pseudo-heterodyne (PSHet) detection scheme 10,11 . These novel interferometric techniques detect both amplitude and phase [12][13][14] of the probe-scattered "near-field signal", which encodes nano-scale near-field optical contrasts from the sample and transmits them to the farfield.…”

Section: Introductionmentioning

confidence: 99%

Model for quantitative tip-enhanced spectroscopy and the extraction of nanoscale-resolved optical constants

et al. 2014

View full text Add to dashboard Cite

Near-field infrared spectroscopy by elastic scattering of light from a probe tip resolves optical contrasts in materials at dramatically sub-wavelength scales across a broad energy range, with the demonstrated capacity for chemical identification at the nanoscale. However, current models of probe-sample near-field interactions still cannot provide a sufficiently quantitatively interpretation of measured near-field contrasts, especially in the case of materials supporting strong surface phonons. We present a model of near-field spectroscopy derived from basic principles and verified by finite-element simulations, demonstrating superb predictive agreement both with tunable quantum cascade laser near-field spectroscopy of SiO2 thin films and with newly presented nanoscale Fourier transform infrared (nanoFTIR) spectroscopy of crystalline SiC. We discuss the role of probe geometry, field retardation, and surface mode dispersion in shaping the measured near-field response. This treatment enables a route to quantitatively determine nano-resolved optical constants, as we demonstrate by inverting newly presented nanoFTIR spectra of an SiO2 thin film into the frequency dependent dielectric function of its mid-infrared optical phonon. Our formalism further enables tipenhanced spectroscopy as a potent diagnostic tool for quantitative nano-scale spectroscopy.

show abstract

“…IR synchrotron radiation is provided by the Advanced Light Source (ALS) at Lawrence Berkeley National Laboratory in two experimental configurations: Beamline 5.4, employing a specially modified AFM (Innova, Bruker) coupled to a commercial FTIR Spectrometer (Nicolet 6700, Thermo-Scientific), and Beamline 2.4 using a commercial nanoscope (neaSNOM, Neaspec GmbH), to measure the spectral near-field scattering amplitude and phase response |S(ω)|e iΦ(ω) . As a direct probe of the sample dielectric function, broadband s-SNOM amplitude and phase typically exhibit simple dispersive and absorptive lineshapes, respectively, for weaker oscillators, and a more complicated hybrid response for strongly resonant and collective excitations [23,30]. The We present additional FIR SINS spectra of representative classses of other material systems in Figure 3, which exhibit important low energy resonant features.…”

mentioning

confidence: 99%

Far Infrared Synchrotron Near-Field Nanoimaging and Nanospectroscopy

et al. 2018

View full text Add to dashboard Cite

Scattering scanning near-field optical microscopy (s-SNOM) has emerged as a powerful imaging and spectroscopic tool for investigating nanoscale heterogeneities in biology, quantum matter, and electronic and photonic devices. However, many materials are defined by a wide range of fundamental molecular and quantum states at far-infrared (FIR) resonant frequencies currently not accessible by s-SNOM. Here we show ultrabroadband FIR s-SNOM nanoimaging and spectroscopy by combining synchrotron infrared radiation with a novel fast and low-noise copper-doped germanium (Ge:Cu) photoconductive detector. This approach of FIR synchrotron infrared nanospectroscopy (SINS) extends the wavelength range of s-SNOM to 31 μm (320 cm −1 , 9.7 THz), exceeding conventional limits by an octave to lower energies. We demonstrate this new nanospectroscopic window by measuring elementary excitations of exemplary functional materials, including surface phonon polariton waves and optical phonons in oxides and layered ultrathin van der Waals materials, skeletal and conformational vibrations in molecular systems, and the highly tunable plasmonic response of graphene.

show abstract

Erratum: Broadband-infrared assessment of phonon resonance in scattering-type near-field microscopy [Phys. Rev. B83, 045404 (2011)]

Cited by 17 publications

References 0 publications

Graphene/h-BN plasmon–phonon coupling and plasmon delocalization observed by infrared nano-spectroscopy

Graphene/h-BN plasmon–phonon coupling and plasmon delocalization observed by infrared nano-spectroscopy

Model for quantitative tip-enhanced spectroscopy and the extraction of nanoscale-resolved optical constants

Far Infrared Synchrotron Near-Field Nanoimaging and Nanospectroscopy

Contact Info

Product

Resources

About