2004
DOI: 10.1103/physrevlett.93.169904
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Erratum: Degradation of Boron-Doped Czochralski-Grown Silicon Solar Cells [Phys. Rev. Lett.,93, 055504 (2004)]

Abstract: The description of the diffusion mechanism of O 2i in the caption of Fig. (3) contained an error in the original article. It should have read: ''A configuration-coordinate diagram for the oxygen dimer. Arrows show the proposed thermally assisted Bourgoin diffusion mechanism with a thermal barrier of 0.3 eV. O sq 2i at A first captures a photogenerated or injected electron and, after overcoming a 0.2 eV barrier, changes its configuration to O st 2i . It then traps a hole becoming O st 2i , and executes a diffus… Show more

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Cited by 21 publications
(33 citation statements)
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“…(16) and (17), can be deduced by fitting the diffusion equation to the dislocation unlocking data [4,9,17]. Oxygen transport to the dislocation is treated in a geometry where the dislocation is parallel to a co-ordinate system's z-axis.…”
Section: Modellingmentioning
confidence: 99%
See 1 more Smart Citation
“…(16) and (17), can be deduced by fitting the diffusion equation to the dislocation unlocking data [4,9,17]. Oxygen transport to the dislocation is treated in a geometry where the dislocation is parallel to a co-ordinate system's z-axis.…”
Section: Modellingmentioning
confidence: 99%
“…Additionally, a SIMS investigation by Heck et al shows that oxygen transport is enhanced in Cz-Si into which boron had been diffused [15]. A theoretical investigation by Adey et al predicts that the activation energy for oxygen dimer diffusion is 0.86 eV in highly doped p-type material, compared with 1.33 eV in lowdoped material [16]. Dislocations in materials can be immobilized by certain impurities, including oxygen.…”
Section: Introductionmentioning
confidence: 96%
“…Although this effect has been known for some time it is only recently that the mechanism has been explained as being due to the formation of a metastable boron-oxygen complex 12,13 . The effect can be reversed by thermal treatments 14 and avoided by doping with gallium instead of boron or reducing the oxygen content of the silicon.…”
Section: Basic Conceptsmentioning
confidence: 99%
“…1 are the two key centers that contribute to LID in crystalline Si. [3][4][5] The goal of this study is to develop an accelerated light-induced degradation (ALID) procedure for fast defect transformation to preselected states corresponding to different recombination activities. Three of these states are listed in Table I.…”
Section: Introductionmentioning
confidence: 99%