1992
DOI: 10.1063/1.352367
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Erratum: ‘‘Growth and characterization of reactively sputtered thin-film platinum oxides’’ [J. Appl. Phys. 69, 1596 (1991)]

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Cited by 14 publications
(16 citation statements)
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“…Knowledge of these values is essential in order to determine (i) kinetic parameters that drive the oxide formation when the process is determined by the rate of escape of Pt 2+ from the metal into the oxide, and (ii) electric field across the growing oxide [32]. In the theoretical data that we present in this paper, we adopt the published XRD data and determine that a Pt 2þ ÀPt 2þ ¼ 3:078Å and a 0 PtÀPt 2þ ¼ 3:444Å [38].…”
Section: Structure Of Pto Layersmentioning
confidence: 97%
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“…Knowledge of these values is essential in order to determine (i) kinetic parameters that drive the oxide formation when the process is determined by the rate of escape of Pt 2+ from the metal into the oxide, and (ii) electric field across the growing oxide [32]. In the theoretical data that we present in this paper, we adopt the published XRD data and determine that a Pt 2þ ÀPt 2þ ¼ 3:078Å and a 0 PtÀPt 2þ ¼ 3:444Å [38].…”
Section: Structure Of Pto Layersmentioning
confidence: 97%
“…The structure and parameters of the electrochemically formed Pt oxide were determined using X-ray diffraction (XRD) and surface X-ray scattering (SXS) [38,39]. The XRD data allow us to calculate the distance between two Pt 2+ cations in the oxide ða Pt 2þ ÀPt 2þ Þ as well as the distance between the Pt atom in the top-most metal layer and Pt 2+ cation in the first oxide monolayer ða 0 PtÀPt 2þ Þ.…”
Section: Structure Of Pto Layersmentioning
confidence: 99%
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“…The unit mesh of the nearly hexagonal Pt layer was very close to that of -PtO 2 (see Fig. 1), suggesting that the overlayer was a distorted PtO 2 layer, azimuthally aligned with the substrate, and oriented with its c axis parallel to the surface normal [16]. Relative to the bulk lattice of -PtO 2 our surface oxide exhibited compressive strain of 3.4% along the 1 10 direction and tensile strain of 2.4% along the 001 direction.…”
mentioning
confidence: 91%
“…Noble metal oxides decompose to metals and oxygen at high temperatures showing the large structural and optical changes [1][2][3][4][5][6][7][8][9][10]. Since the thermal decomposition of noble metal oxides has a specific threshold temperature, an optical disk storage system using the decomposition phenomena of silver oxide (AgO x ) thin films induced by laser heating has been proposed [11,12].…”
Section: Introductionmentioning
confidence: 99%