Abstract:Fringe patterns are widely applied in optical metrology, and phase retrieval is an essential process for decoding surface information. In the field of phase measurement deflectometry (PMD), phase errors in the phase retrieval process have more significant effects for PMD is a slope-based technique and is more sensitive to low-frequency errors. The main factors affecting the quality of the captured fringe images include the gamma effect of the liquid crystal display (LCD) screen, the random noise from the charg… Show more
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