2019
DOI: 10.1016/j.procs.2020.01.078
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Error Detection of Data Conversion in Flash ADC using Code Width Based Technique

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Cited by 4 publications
(1 citation statement)
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“…In [14], the built-in self-test (BIST) scheme was introduced based on the code width technique, which is used for error detection, and utilised a linear analog ramp signal applied to a 7-bit ADC fash type to create a digital sequence for testing. Te curve ftting method is widely used to reduce purity requirements and decrease harmonic distortion and is considered an efective method to solve INL errors, as presented in [15,16].…”
Section: Error Detection and Correctionmentioning
confidence: 99%
“…In [14], the built-in self-test (BIST) scheme was introduced based on the code width technique, which is used for error detection, and utilised a linear analog ramp signal applied to a 7-bit ADC fash type to create a digital sequence for testing. Te curve ftting method is widely used to reduce purity requirements and decrease harmonic distortion and is considered an efective method to solve INL errors, as presented in [15,16].…”
Section: Error Detection and Correctionmentioning
confidence: 99%